Catálogos >
Keithley Instruments >
Power Device Testing Solutions for Design Validation, Characterization, and Reliability

Power Device Testing Solutions for Design Validation, Characterization, and Reliability
1 / 2Páginas

Excertos do catálogo

Power Device Testing Solutions for Design Validation, Characterization, and Reliability - 1

Power Semiconductor Device Testing Solutions for Design Validation, Characterization, and Reliability Learn Tips and Techniques for Practical DC and AC Testing of Today’s Power Semiconductor Devices You face considerable challenges testing today’s power semiconductor devices, especially those that use advanced materials like Silicon Carbide (SiC) and Galium Nitride (GaN). Higher voltages and power levels Faster switching times Higher peak currents Lower leakage times The Tektronix/Keithley product portfolio spans DC and AC (time domain) measurements. We offer unique static and dynamic test and measurement solutions for design validation, characterization, and reliability testing of power semiconductor devices.

Abrir o catálogo na página 1

Power Device Testing Solutions for Design Validation, Characterization, and Reliability - 2

Explore our DC and AC Power Semiconductor Device Testing Solutions Visit our reference library at www.keithley.com/powerdevice to learn more. Source Measure Unit (SMU) Instruments n Single- or dual-channel, high speed, precision, DC characterization, and test instruments n From 100A to 0.1fA, 3kV to 100μV, up to 2000W pulsed power, single- or dual-channel n TSP-Link® technology links Series 2600 SMU instruments to form powerful multi-channel systems that rival the system speed of large ATEs Parametric Curve Tracer Configurations n Offers the best of a curve tracer and parametric analyzer...

Abrir o catálogo na página 2