Catálogos >
Keithley Instruments >
Nanotechnology Measurement

Nanotechnology Measurement
1 / 13Páginas

Excertos do catálogo

Nanotechnology Measurement Handbook A Guide to Electrical Measurements for Nanoscience Applications Nanotechnology Measurement Handbook Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. © Copyright 2007 Keithley Instruments, Inc. Printed in the U.S.A. Corporate Headquarters • 28775 Aurora Road • Cleveland, Ohio 44139 • 440-248-0400 • Fax: 440-248-6168 • 1-888-KEITHLEY (534-8453) www.keithley.com

Abrir o catálogo na página 1

“To get a free electronic version of this book, visit Keithley’s Knowledge Center web page.” a g r e at e r m e a s u r e o f c o n f i d e n c e

Abrir o catálogo na página 2

Nanotechnology Measurement Handbook A Guide to Electrical Measurements for Nanoscience Applications

Abrir o catálogo na página 3

Foreword Nanotechnology research often demands skills in multiple disciplines, from physics and materials science to chemistry and measurement system design. Although it would be impossible to predict all the technical innovations that nano research will offer, it’s already clear that nanoscience will be a major driver of the economy of the future. However, characterizing tomorrow’s nanoscale components and materials will be far from trivial because many of their electrical properties lie at the very edge of the measurement envelope. To unravel tiny mysteries and turn nanoscale materials...

Abrir o catálogo na página 4

Nanotech Innovations Hinge on Measurement Technology and Close Alliances Between Researchers and Instrumentation Designers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2 S e ct i o n I I Nanotechnology Testing Overview Emerging Challenges of Nanotech Testing . . . . . . . . . . . . . . . . . . . . . . 2-2 Electrical Measurements on Nanoscale Materials . . . . . . . . . . . . . . . . 2-6 S e ct i o n II I Low-Level Measurement Techniques Recognizing the Sources of Measurement Errors: An Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....

Abrir o catálogo na página 5

Nanodevice Measurement Techniques Tips for Electrical Characterization of Carbon Nanotubes and Low Power Nanoscale Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2 Appendix A Selector Guides . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A-1 Appendix B Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . C-1 Appendix D

Abrir o catálogo na página 6

Nanotechnology Measurement handbook

Abrir o catálogo na página 7

Nanotech Innovations Hinge on Measurement Technology and Close Alliances Between Researchers and Instrumentation Designers Nanotechnology has the potential to improve our quality of life in diverse ways, such as faster electronics, huge memory/storage capacities for PCs, cheaper energy through more efficient energy conversion, and improved security through the development of nanoscale bio- and chemical-detection systems. Before these become commercial realities, researchers must be able to characterize nano material and device properties quickly and accurately. Optical and electro-optical...

Abrir o catálogo na página 8

d isciplines. Alliances with instrumentation companies allow leveraging the expertise of individuals and organizations to create better solutions for researchers. Measurement Complexities The essence of nanotechnology research is to work at the molecular level, atom by atom, to create structures with fundamentally new properties. Some of the current research involves: • Carbon nanotube materials and field emission devices • Semiconducting nanowires of silicon and other materials • Polymer nanofibers and nanowires • Nano and molecular electronics • Single electron devices One of the main...

Abrir o catálogo na página 9

manipulation and nanoprobing tools are essential in constructing a complete measurement solution. By working together closely, nano researchers and instrumentation manufacturers can create innovative and comprehensive measurement solutions that are essential for developing the next generation of nanostructures, nanomaterials, MEMS (MicroE lectro-Mechanical Systems), and semiconductor devices. These alliances will also be instrumental in speeding up the transfer of nanotechnology from the research lab to the production environment.

Abrir o catálogo na página 10

“To get a free electronic version of this book, visit Keithley’s Knowledge Center web page.” a g r e at e r m e a s u r e o f c o n f i d e n c e

Abrir o catálogo na página 11

Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. Keithle y Instruments, Inc . ■ 28775 Auror a Road ■ Cle vel and, Ohio 44139 -1891 440 -248- 0400 ■ Fax: 440 -248- 6168 ■ 1-888-KEITHLEY ■ w w w.keithley.com Belgium Sint-Pieters-Leeuw Ph: 02-363 00 40 Fax: 02-363 00 64 w w w.keithley.nl china Beijing Ph: 8610 -82255010 Fax: 8610 -82255018 w w w.keithley.com.cn finland Espoo Ph: 09-88171661 Fax: 09-88171662 w w...

Abrir o catálogo na página 12