2606B
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2606B System SourceMeter® SMU InstrumentDatasheet The 2606B System SourceMeter Source Measure Unit (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. Built from Keithley's third generation SMU technology, the 2606B offers the combined capabilities of a precision power supply, true current source, 6^-digit DMM, arbitrary waveform generator, and pulse generator-all into one tightly-integrated instrument. The result is a powerful solution that significantly boosts productivity for demanding automated qualification and production testing for optoelectronic devices such as VCSELs/laser diodes used in 3D sensing, telecommunication, and LEDs used in consumer products and automobiles, as well as integrated devices like analog ICs, ASICs, and system-on-a-chip (SOC) devices. When a high SMU channel count is required, multiple 2606B units can be stacked on top of each other without the need for thermal spacing between units. Built-in web browser-based software enables communicating to the 2606B through any computer from anywhere in the world. For automated system applications, the 2606B's Test Script Processor (TSP®) technology runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, Keithley's TSP-Link® technology works together with TSP technology to enable high-speed, SMU-per-pin parallel testing. Each 2606B SMU is code compatible with the industry leading Keithley 2602B System SourceMeter SMU Instrument when you are using the new ranges. Key Features • Four-channel SMU instrument in a single 1U full rack chassis • Stackable; no 1U spacing requirements between units • Tightly-integrated voltage/current source and measure instruments offer best in class performance with 6^-digit resolution • 20 V @ 1 A and 6 V @ 3 A power envelopes, 20 watts • 0.015% DCV basic accuracy • Up to 28 open drain digital I/O bits • Correlated results to the 2602B System SourceMeter SMU Instrument • TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput • TSP-Link expansion technology for multi-channel parallel test without a mainframe • Front Panel LAN (LXI-C), USB 2.0 TMC488 protocol, and digital I/O interfaces • Built-in web browser based software enables remote control through any browser, on any computer from anywhere in the world

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Unmatched Throughput for Automated Test with TSP Technology For test applications that demand the highest levels of automation and throughput, the 2606B’s TSP technology delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers – it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates time-consuming bus communications to and from the PC controller and thus dramatically improves overall test times. All channels in the TSP-Link system are synchronized to under 500 ns. • Conditional...

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2606B System SourceMeter ® SMU Instrument Typical Applications I-V functional test and characterization of a wide range of devices, including: • Optoelectronic devices – Vertical cavity surface emitting lasers (VCSELs), laser diodes (used on 3D sensing systems) – High brightness (HBLEDs), lightemitting diodes (LEDs) 2606B SMU instruments are easily racked and stacked in a rack system with minimum rail depth of 27 inches (0.686 m). Third-generation SMU Instrument Design Ensures Faster Test Times Based on the proven architecture of the Series 2600B instruments, the 2606B’s SMU instrument...

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Specification Conditions This document contains specifications and supplemental information for the 2606B System SourceMeter® instrument. Specifications are the standards against which the 2606B instruments are tested. Upon leaving the factory, the 2606B instruments meet these specifications. Supplemental and typical values are nonwarranted, apply at 23°C, and are provided solely as useful information. Specifications are for individual modules. Source and measurement accuracies are specified at the 2606B terminals under these conditions: 2. After a two-hour warm-up period 3. Speed normal (1...

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2606B System SourceMeter ® SMU Instrument Current Accuracy Specifications 3 Source Range Programming Resolution Accuracy ±(% reading + amperes) Measure Typical Noise (peak to peak) 0.1 Hz to 10 Hz Display Resolution Accuracy 5 ± (% reading + amperes) Supplemental Characteristics The following specifications are supplemental characteristics that provide additional information about instrument functions and performance. These characteristics are nonwarranted specifications; they describe the typical performance of the 2606B. Additional Source Characteristics < 20 mV peak-peak, < 3 mV RMS, 6 V...

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Pulse Width Programming Accuracy ±5 |js Pulse Width Jitter 2 js Transient Response Time <70 js for the output to recover to within 0.1% for a 10% to 90% step change in load. Overshoot Voltage: <±0.1% of range + 10 mV. Step size = 10% to 90% of range, resistive load, maximum current limit/compliance Current: <±0.1% of range. Step size = 10% to 90% of range, resistive load. See Current Source Output Settling Time for additional test conditions. Range Change Overshoot Voltage: <300 mV + 0.1% of larger range. Overshoot into a 100 kO load, 20 MHz bandwidth. Current 7: <300 mV/RLOAD + 5% of...

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2606B System SourceMeter® SMU Instrument Additional Measurement Characteristics Current Measure Settling Time 10 Time required to reach within 0.1% of final value after source level command is processed on a fixed range. Values below for Vout = 1 V Notes 10. Compliance equal to 100 mA. 11. Tests performed using the following equipment: Computer hardware — Intel® Core™ i7 at 2.90 GHz, 8 GB RAM; software — Microsoft® Windows® 10 Enterprise 64-bit, Microsoft® Visual Studio® 2010, VISA™ version 5.8. 12. Exclude current measurement ranges less than 1 mA.

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