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2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument

2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument
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2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument - 1

TEC SourceMeter SMU Instrument Autotuning TEC SourceMeter SMU Instrument The Models 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately. Ordering Information 2510 TEC SourceMeter 2510-AT Autotuning TEC SourceMeter SMU Instrument Accessories Supplied User’s Manual, Input/Output Connector Resistive Heater Adapter for Model 2510 4-Wire Unshielded Cable, Phoenix Connector to Unterminated End Shielded IEEE-488 Cable, 1m (3.3 ft) Shielded IEEE-488 Cable, 2m (6.6 ft) IEEE-488 Interface/Controller for the PCI Bus IEEE-488 USB-to-GPIB Adapter for USB Port 1-year factory warranty extended to 3 years from date of shipment 2510-AT-3Y-EW 1-year factory warranty extended to 3 years from date of shipment C/2510-3Y-DATA 3 (Z540-1 compliant) calibrations within 3 years of purchase for Models 2510, 2510-AT* *Not available in all countries The Model 2510‑AT expands the capability of the Model 2510 by offering autotuning capability. P, I, and D (proportional, integral, and derivative) values for closed loop temperature control are determined by the instrument using a modified Zeigler-Nichols algorithm. This eliminates the need for users to determine the optimal values for these coefficients experimentally. In all other respects, the Model 2510 and Model 2510‑AT provide exactly the same set of features and capabilities. The SourceMeter Concept M The Model 2510 and Model 2510-AT draw upon Keithley’s unique Source eter concept, which combines precision voltage/current sourcing and measurement functions into a single instrument. SourceMeter SMU instruments provide numerous advantages over the use of separate instruments, including lower acquisition and maintenance costs, the need for less rack space, easier system integration and programming, and a broad dynamic range. Part of a Comprehensive LIV Test System In a laser diode CW test stand, the Model 2510 or Model 2510-AT can control the temperature of actively cooled optical components and assemblies (such as laser diode modules) to within ±0.005°C of the user-defined setpoint. During testing, the instrument measures the internal temperature of the laser diode module from any of a variety of temperature sensors, then drives power through the TEC within the laser diode module in order to maintain its temperature at the desired setpoint. Figure 1. The capabilities of the Models 2510 and 2510-AT are intended to complement those of other Keithley instruments often used in laser diode module LIV testing, including the Model 2400 and 2420 SourceMeter SMU instruments, the Model 2502 Dual Photo iode Meter, d and the Model 2500INT Integrating Sphere. Precision temperature control for TECs with autotuning PID for optimal performance Trigger Link 1.888.KEITHLEY (U.S. only) www.keithley.com A Greater Measure of Confidence

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2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument - 2

TEC SourceMeter SMU Instrument Autotuning TEC SourceMeter SMU Instrument ® • 50W TEC Controller combined with DC measurement functions • Fully digital P-I-D control TMAX Max. Initial Slope • Autotuning capability for the thermal control loop (2510-AT) • Designed to control temperature during laser diode module testing • Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) • Compatible with a variety of temperature sensor inputs— thermistors, RTDs, and IC sensors • Measures and displays TEC parameters during the control cycle...

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2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument - 3

TEC SourceMeter SMU Instrument Autotuning TEC SourceMeter SMU Instrument High Stability P-I-D Control When compared with other TEC controllers, which use less sophisticated P-I (proportional-integral) loops and hardware control mechanisms, this instrument’s software-based, fully digital P-I-D control provides greater temperature stability and can be easily upgraded with a simple firm ware change. The resulting temperature stability (±0.005°C short term, ±0.01°C long term) allows for very fine control over the output wavelength and optical power of the laser diode module during production...

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2510 2510-AT TEC SourceMeter® SMU Instrument Autotuning TEC SourceMeter SMU Instrument - 4

SEMICONDUCTOR Model 2510, 2510-AT specifications THERMAL FEEDBACK ELEMENT SPECIFICATIONS3 Sensor Type RTD Thermistor SPECIFICATIONS The Models 2510 and 2510-AT TEC SourceMeter SMU instruments are designed to: Control the power to the TEC to maintain a constant temperature, current, voltage, or thermistor resistance Measure the resistance of the TEC Provide greater control and flexibility through a software P-I-D loop . CONTROL SYSTEM SPECIFICATIONS SET: Constant Peltier Temperature, Constant Peltier Voltage, Constant Peltier Current . Constant Thermistor Resistance . CONTROL...

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