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Phased Array Inspections Probe Catalog Phased Array Probes and Wedges • Solution-Specific Probes • Angle Beam Probes • Immersion Probes • Integrated Wedge Probes • Curved Array Probes
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Table of Contents Technical Information Introduction to Phased Array Technology. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Custom Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ordering Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Phased Array Probes Application Matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
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Introduction to Phased Array Technology High-Speed Scans with No Moving Parts The distinguishing feature of phased array ultrasonic testing is the computer-controlled excitation (amplitude and delay) of individual elements in a multielement probe. Through software, the excitation of multiple piezocomposite elements generates a focused ultrasonic beam, enabling the dynamic modification of beam parameters such as angle, focal distance, and focal spot size. To generate a beam in phase by means of constructive interference, the various active transducer elements are pulsed at slightly different...
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Custom Probes Phased Array Probes Olympus can manufacture custom phased array probes to suit specific applications and geometries. To develop your custom probe, we will need to know: • Application • Comparable UT single element transducer • Cable length • Number of elements, pitch, and elevation • Cable jacket required • Connector style • Array shape (flat, curved) • Probe type (angle beam, immersion, integrated wedge, matrix) • Housing restrictions and/or size constraints -- Curved in active dimension -- Curved in passive dimension (focused) Variable angle Dual linear Internal focus Phased...
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Connector type Cable length Cable type Casing type Probe type Frequency 1.5 = 1. 5 MHz 2.25 = 2 .25 MHz 3.5 = 3 .5 MHz 5 = 5 MHz 7.5 = 7 .5 MHz 10 = 10 MHz Additional frequencies available upon request Array type L = Linear A = Annular M = Matrix probe (1. 5D, 2D) CV (ROC) = Convex in azimuth CC (ROC) = Concave in azimuth CCEV (ROC) = Elevation focused ROC: radius of curvature (mm) Prefix Before Array Type D = Dual Array T = Tri Array Q = Quad Array Example DL = Dual Linear Array Casing type Casing type for a given probe type Cable type P = PVC Sheathing M = Metal Armor Sheathing HF =...
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Small-Diameter Pipe Welds (COBRA® Scanner) Weld Series Advantages • Design optimized for weld inspection • Leading-edge signal-to-noise ratio performance • Wide thickness range • Improved coupling to the part • Acoustically matched to Rexolite Typical Applications A31 and A32 Probes • Manual or automated inspection of 3 mm to 60 mm thick welds using angle beams • Innovative wedge design available for shear or longitudinal waves Advantages • Uses low-profile phased array probes with optimized elevation focusing for improved detection of small defects in thin-wall pipes Simulation displays a...
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Corrosion Mapping Austenitic, Nickel, and Other Coarse-Grained Alloys HydroFORM® Scanner Advantages • Local immersion technique • Coupling is optimized, enabling inspection of rough surfaces • Large coverage • Wedge reflection is eliminated • Easy synchronization on front wall for OD and ID corrosion monitoring Typical Applications I4 Probes Corrosion Mapping Applications • Manual or automated corrosion inspection of medium to large areas for remaining wall or internal corrosion measurements Dual Linear Array (DLA) Corrosion Probe Advantages • Pitch-catch technique • Considerable reduction...
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Wheel Probes RollerFORM® Scanner EdgeFORM™ Scanner Advantages • Exceptional coupling with minimal couplant • Easy set up for efficient C-scan • 25 mm (0.98 in.) water delay line enables inspection of composites up to 50 mm (1.97 in.) thick • Up to 51.2 mm (2.03 in.) wide beam coverage • Clear and low attenuation wheel material Typical Applications IWP1 Probes Composite Applications • Zero degree inspection of composite and other smooth-surface materials • Can be used in accordance with existing aircraft manufacturer procedures Probe Specifications and Dimensions Advantages • Exceptional...
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Laterally Focused Arrays (CCEV) These probes for girth weld inspection used with the PipeWIZARD system or COBRA® scanner have curved elements in the passive plane, focusing the beam in the lateral direction. An integrated lens permits the use of standard wedges. These cylindrically-focused probes significantly reduce oversizing and excessive repair. Their capacity to discriminate small indications is a major advantage when sizing the length of an intermittent defect using interaction rules. In addition, beam energy is better maintained in small pipe/thin wall applications. Advantages • PWZ1...
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Immersion Probes Immersion probes are designed to be used with a water wedge or in an immersion tank when the test part is partially or fully immersed. Advantages • Shortened dead zone at both ends (1.5 mm between center of first or last element and housing edge) • Well-suited for composite channel inspections • C-scan inspection of composites (delamination, disbonding, and porosity) Aqualene Wedge SNW1-0L-AQ25 The Olympus Aqualene wedge promotes exceptional coupling, improved measurements, and enhanced nearsurface resolution. Aqualene wedges are available for NW1, NW2, and NW3 phased array...
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Code Compliant ProbesDGS1 and A24 Atlas Series Probes 4L16-DGS1 Advantages • Acoustic impedance matched to water • High circumferential resolution around the radius • Corrosion-resistant stainless steel case • Waterproof up to 1 m (3.28 ft) underwater • Compatible with adjustable immersion wedges (shown on page 28) Typical Applications • Inspection of carbon fiber-reinforced polymer (CFRP) corners • Composite inspection for delamination Advantages • Probe and wedge in the same housing • Lowest-profile probe-and-wedge combination for contact angle beam inspection • Due to probe manufacturing...
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