ZEISS Xradia Versa Family

ZEISS Xradia Versa Family

ZEISS Xradia Versa Family

Product catalog summary
Overview
ZEISS Xradia Versa Family offers advanced 3D X-ray microscopes (XRM) that provide high contrast and submicron resolution imaging for large samples. The technology utilizes a two-stage magnification technique and innovative source technology to achieve Resolution at a Distance (RaaD) and faster results. These microscopes support diverse applications such as phase contrast, 4D, in situ, and crystallographic imaging, and are built on upgradeable platforms.
Product Line
  • ZEISS Xradia 620 Versa: The flagship model with advanced 3D imaging capabilities, higher X-ray flux, and extensive filtering options.
  • ZEISS Xradia 610 Versa: Offers enhanced throughput and image quality with breakthrough source technology.
  • ZEISS Xradia 510 Versa: Provides foundational 3D imaging capabilities without advanced features.
  • ZEISS Xradia 410 Versa: Bridges high-performing 3D X-ray microscopy and lower-cost CT systems.
Benefits
  • Non-destructive 3D imaging with high resolution at large working distances.
  • Multi-length scale imaging and advanced contrast solutions.
  • High X-ray flux for faster throughput and better signal-to-noise ratio.
  • 4D and in situ capabilities for flexible sample sizes.
  • Easy workflow setup with Scout-and-Scan control system.
  • Minimal sample preparation and ability to program multiple samples.
Field of Application
  • Materials Research: Characterize materials, observe failure mechanisms, and analyze microstructural evolution.
  • Life Sciences: Visualize tissues, cells, and microstructures in plants and small animals.
  • Natural Resources: Characterize pore structures and measure fluid flow for oil, gas, and mining.
  • Electronics and Semiconductor: Conduct failure analysis on intact packages.
  • Manufacturing Technology: Analyze 3D printed parts and perform mechanical testing.
  • Battery and Energy Storage: Conduct failure analysis and quality inspection of components.
Technical Specifications
  • Spatial Resolution: Ranges from 0.9 μm to 0.5 μm depending on the model.
  • Resolution at a Distance (RaaD): 1.5 μm to 1.0 μm.
  • Minimum Achievable Voxel: 100 nm to 40 nm.
  • X-ray Source Architecture: Sealed Reflection and Sealed Transmission with Fast Activation.
  • Voltage Range: 20 – 160 kV.
  • Maximum Output: 8 W to 25 W.
Features
  • Innovative detector turret with multiple objectives.
  • Scout-and-Scan™ Control System and XRM Python API for customized control.
  • Optional features like ZEISS LabDCT, Autoloader, and DeepRecon Pro.
See more

Catalog excerpts

ZEISS Xradia Versa Family-1

Your 3D X-ray microscope for advanced discovery ZEISS Xradia Versa Family non-destructive, 3D imaging empower ZEISS Xradia 610 Versa a breadth of technical disciplines with a With breakthrough source technology, diverse range of sample sizes, geometries Xradia 610 Versa builds on the estab- lished Xradia 510 Versa and provides platform enables unique applications higher X-ray flux that results in enhanced like phase contrast, 4D, in situ and throughput and image quality. crystallographic imaging. ZEISS X-ray microscopes are built on upgradeable, ZEISS Xradia 510 Versa extendable, and reliable platforms that Xradia 510 Versa is the foundation of help protect your capital investment. the Xradia Versa family for those who need the best 3D imaging capability Synchrotron Quality Image ZEISS Xradia 620 Versa without all of the advanced features ZEISS X-ray microscopes (XRM) are The flagship product of the award- advanced imaging solutions that have winning Xradia Versa family provides the removed major hurdles for 3D imaging most advanced and highest performing ZEISS Xradia 410 Versa by achieving high contrast and submicron non-destructive, 3D imaging and analysis Xradia 410 Versa bridges the gap resolution imaging even for relatively capabilities. Xradia 620 Versa extends between high-performing 3D X-ray large samples. The Xradia Versa family microscopy solutions and traditionally uses a two-stage magnification technique imaging with higher X-ray flux across lower-cost, less capable projection- and breakthrough innovations in source operating conditions, advanced contrast based computed tomography (CT) technology to enable you to simultaneously tuning capabilities, extensive filtering systems. Multiple source options and uniquely achieve resolution at a options, and advanced acquisition provide flexibility for imaging a distance (RaaD) and faster time-to-results. modalities for maximum flexibility and wide range of sample sizes and types. These ground-breaking advances in workflow automation. Zebrafish, <700 nm resolution and high contrast to view cellular structures Analysis of Ti-6Al-4V raw powder used in additive manufacturing applications.

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ZEISS Xradia Versa Family-2

ZEISS Xradia 410 Versa ZEISS Xradia 510 Versa ZEISS Xradia 610 Versa ZEISS Xradia 620 Versa Spatial Resolution[a] [a,b] Resolution at a Distance (RaaD™) Minimum Achievable Voxel[c] (Voxel size at sample at maximum magnification) Sealed Transmission, Fast Activation 30 – 160 kV 25 W Sealed Transmission, Fast Activation 30 – 160 kV 25 W X-ray Source Architecture Sealed Reflection Sealed Transmission Voltage Range Maximum Output Detector System ZEISS X-ray microscopes feature an innovative detector turret with multiple objectives at different magnifications. Each objective features optimized scintillators...

 Open the catalog to page 2

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