Group: ZEISS
Catalog excerpts
Nanoscale X-ray Imaging: Explore at the Speed of Science ZEISS Xradia Ultra Family
Open the catalog to page 1Nanoscale X-ray Imaging: Explore at the Speed of Science › With ZEISS Xradia Ultra you benefit from nanoscale imaging, superior contrast and lab accessibility. Accelerate your research with synchrotron-quality 3D X-ray nanotomography. Put the ZEISS Xradia Ultra 800-family of X-ray microscopes (XRMs) to work in your lab and unleash the power of the most advanced models in the laboratorybased portfolio of ZEISS XRMs. Now you observe materials phenomena in their native environments, using in situ experiments enabled by unique non-destructive nanoscale imaging at resolutions down to 50 nm....
Open the catalog to page 2Nanoscale Imaging. Superior Contrast. Lab Accessibility. › Supercharge Your Research with Non- For Superior Contrast and Image Quality Extend the Boundaries of Your Lab Harness the power of unique non-destructive Observe microstructures and nanoscale defects in The synchrotron-adapted optics of Xradia Ultra imaging to observe nanoscale phenomena in their 3D without destroying your sample. There’s no provide a new level of understanding in science native environments and perform sub-surface risk of data being altered by slicing artifacts either. and industry labs. This not only removes...
Open the catalog to page 3Your Insight into the Technology Behind It › Resolve Nanoscale Features Using X-rays in a Unique Set-up Unique among laboratory-based microscopes, Xradia Ultra enables you to leverage the penetrating power of X-rays to accomplish nondestructive 3D imaging with resolution down to 50 nm, the highest achievable by lab-based microscopes. Flexible contrast modes and unique X-ray optics provide you with unmatched versatility for a diverse array of applications and sample types. Researchers have long recognized the potential of short wavelength X-rays for achieving highresolution imaging in the...
Open the catalog to page 4Your Insight into the Technology Behind It › Consider the Advantages of Synchrotron-like X-ray Optics Traditional light or electron optics schemes are not suitable for X-rays because refraction is extremely weak and X-rays are not deflected in magnetic fields. Instead, Xradia Ultra employs proprietary X-ray optics originally developed at synchrotron facilities and optimized by ZEISS for a wide variety of lab-based applications. Discover the full benefits of synchrotron-adapted architecture by using: • reflective capillary condensers, precision-fabricated to match the source properties and...
Open the catalog to page 5Your Insight into the Technology Behind It › How Nanoscale X-ray Imaging is Achieved – Transmission X-ray Microscopy (TXM) Architecture The architecture of Xradia Ultra is conceptually equivalent to that of an optical or transmission electron microscope (TEM): • A high-brightness X-ray source is focused onto the specimen by a high-efficiency capillary condenser • Fresnel zone plate objectives image transmitted X-rays onto the detector • You can insert an optional phase ring into the beam path to achieve Zernike phase contrast to visualize fine features in low-absorbing specimens • As the...
Open the catalog to page 6Your Insight into the Technology Behind It › ZEISS Xradia 810 or 800 Ultra – Choose the Right X-ray Energy Optimized for Your Applications In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput...
Open the catalog to page 7Your Insight into the Technology Behind It › ZEISS Xradia 810 or 800 Ultra – Choose the Right X-ray Energy to Optimize Image Contrast X-ray Penetration: Medium Density Material 1.2 Medium Density Material 10 µm Dentin imaged at 5.4 keV, left, and 8.0 keV, right. At 5.4 keV with Xradia 810 Ultra, acquisition is 10 times faster for equivalent image quality due to optimized contrast. Relative Intrinsity A greater attenuation of X-rays at 5.4 keV (Xradia 810 Ultra) provides superior contrast and higher throughput for low to medium density materials. 5.4 keV X-ray Penetration: High Density...
Open the catalog to page 8Your Insight into the Technology Behind It › Apply Multiple Contrasts for Diverse Sample Types Xradia Ultra offers both absorption and phase contrast imaging to optimize your ability to visualize features of interest in a wide range of samples. Absorption contrast imaging, essentially shadow or projection imaging, utilizes the varying attenuation power of different materials to generate contrast. It is best suited to your specimens that contain materials of varying density—for example, material and pore space. Phase contrast imaging utilizes the refraction of X-rays rather than absorption....
Open the catalog to page 9Your Insight into the Technology Behind It In Brief Bridge the In Situ Testing Gap Todays’ materials research deals with properties of materials that emerge under non-ambient condi- tions or external stimuli. When your goal is to observe microstructural changes occurring under these conditions or stimuli, and to link those testing methods and changes in live imaging allow you to do exactly that. Xradia Ultra is uniquely suited to in situ experiments and imaging at the changes to the material’s performance, in situ Samples Thin Sections nanoscale: it lets you image 3D structures...
Open the catalog to page 10Your Insight into the Technology Behind It › Explore Nanomechanics with In Situ Loading Experiments Mechanical properties of materials are intricately linked to their microstructure, especially for highly structured materials like composites, foams, rocks, and biomaterials. ZEISS Xradia Ultra Load Stage takes you deep into a critical new length scale of materials characterization. Use it to observe internal features such as nanoscale cracks and voids that initiate under load. Gain a nanoscale view of material deformation and failure. Then, connect these features with properties observed on...
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