Systems Catalog ED-XRF Spectrometers For over 30 years Xenemetrix Ltd. specializes in the design, development, production and marketing of Energy-Dispersive X-Ray Fluorescence (ED-XRF) systems

The Power to Change Energy Into Information

ED-XRF Spectrometers Energy-Dispersive X-Ray Fluorescence (ED-XRF) systems spectroscopy is one of the simplest, most accurate and economical analytical methods for determination of chemical composition for many types of materials. We combine the latest technological developments with innovative engineering, to provide cost-effective solutions to a wide range ofindustries and applications. An emphasis on quality combined with ongoing research and development has granted the company an international reputation for excellence. innovative technologies Xenemetrix continuously develops highly innovative...

The Power to Change Energy Into Information

About Xenemetrix ED-XRF Elemental Analysis ED-XRF is relatively simple and inexpensive elemental analysis technology compared to other techniques. XRF found its place in many different types of analytical laboratories. Using ED-XRF allows measuring a wide range of elemental concentrations without the need for complicated sample preparations (heating or destroying the sample). Samples can be measured in the form of loose powders or pressed into pellets and ready for measurement within seconds. Because of these advantages the ED-XRF technique has a broad appeal to research, industrial, and quality...

Petrochemical & Petroleum ED-XRF offers a low cost quantitative analysis method that achieves fast results that complies with ASTM standards and regulations. Xenemetrix systems provide accurate determination of trace amount to percent levels of elements in fuels, oils, and lubricants. Our superior solutions cover the full refinery production process, starting from research and development up to process and quality control. Used in a wide variety of petrochemical & petroleum applications to identify elements and determine the actual elemental concentrations present in a variety of matrices (solid,...

Mining & Geochemistry ED-XRF spectrometers provide on-site quantitative analysis of mining materials and minerals. Xenemetrix advanced ED-XRF spectrometers reduce the time of receiving results from days to seconds, making it also ideal for the exploration industry, delivering excellent precision and accuracy of critical measurements, as well as the low limits of detection (LOD). Cement - ED-XRF is being used to analyze raw meal, clinker, and the final cement product (Na, Mg, Al, Si, S, K, Ca, and Fe in Cement, Clinker, and Raw Meal). Limestone is the major component of cement. It is one of the...

Metals & Alloys ED-XRF plays a dominant role in quality control of the various metal industry processes. Non-destructive elemental analysis can be performed in each step of the process, from ores to finished alloys. ED-XRF is capable of easy and fast sorting between different steel grades, as well as forming a convenient for QA processing analytical tool that provides immediate results. Specific applications include: Alloy Analysis- Alloy analysis using Xenemetrix spectrometers has become a standard practice. Xenemetrix spectrometers identify most alloys and perform complete chemical analysis...

Cosmetics Many additives in cosmetic products are mineral or organic with add-ons of elements that are measurable by ED-XRF. Xenemetrix systems are ideal during the manufacturing process of cosmetic products, which need to be chemically analysed to ensure conforming to product specification and safety regulations, as well as achieving cost-effectiveness in the manufacturing process. Several well-known applications include: Titanium and Zinc in Sunscreen- Titanium dioxide is used in most sunscreens to help prevent UV radiation burns. The concentration is high and can easily be measured by ED-XRF....

Portable Field Laboratory The P-Metrix is engineered to provide a portable field laboratory with safe and superior Energy Dispersive X-Ray Fluorescence (EDXRF) quantitative and qualitative analysis. P-Metrix is a highpower analyzer that incorporates performances and safety of a top-grade ED-XRF benchtop analyzer, combined with easy mobility, light weight, compact size and cost-effective benefits of a portable device and field engineered. Non-destructive Elemental analysis Na (11) to U (92) from ppm to 100% concentrations Silicon Drift Detector (SDD) higher-count rate and resolution, down to 125eV...

Low Cost Compact Benchtop The compact cost-effective spectrometer fits comfortably on a traditional laboratory bench and include a fully integrated computer system, six customizable filters and a sample tray. The Xenemetrix bench-top spectrometer use a high resolution detector and a powerful X-Ray tube and a sample camera in order to accommodate samples of various sizes and types. Non-destructive elemental analysis Na (11) - U (92) from ppm to 100% concentrations Six customizable filters for fast and accurate determination of trace and minor elements Compact geometry Sample camera Sample tray...

Compact High Performance Benchtop The compact benchtop spectrometer with unique front - Anode geometry and high power excitation X-ray source fits comfortably on a traditional laboratory bench and include a fully integrated computer system, six customizable filters, sample tray and a sample camera. The Xenemetrix bench-top spectrometer use a high resolution detector and a powerful X-Ray tube, in order to accommodate samples of various sizes and types. The X-Calibur has an optional Ultrathin detector window that provides superior performance for low Z elements (Light Element) analysis. Non-destructive...

Unique Secondary Target Benchtop The compact spectrometer provides a non-destructive qualitative and quantitative determination from Na (11) - U (92) , providing detection limits from sub-ppm to high weight percent concentrations. The Genius IF has a unique patented geometry combining eight secondary targets, with eight customizable tube filters used in direct excitation mode, to allow optimal excitation of all elements that can be detected in ED-XRF. The WAG (Wide Angle Geometry) patented secondary target technique provides the best results for major, minor and trace element analysis. Non-destructive...