Phoenix Microme|x Neo and Nanome|x Neo
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High performance X-ray inspection solution with non-destructive planarCT board inspection Microme|x neo 160 Microme|x neo 180 Nanome|x neo 180

Phoenix Microme|x Neo and Nanome|x Neo High resolution 160/180 kV micro- / nanofocus X-ray inspection systems with 3D CT option The Phoenix MicromeIx neo and NanomeIx neo series combines high-resolution 2D X-ray technology and 3D CT in one system. Innovative and unique features and an extreme high positioning accuracy make both systems the effective and reliable solution for a wide spectrum of 2D and 3D offline inspection tasks: R&D, failure analysis, process and quality control. The Phoenix|x-ray X|act technology offers easy to program CAD based µAXI ensuring automated inspection in the...

Waygate Technologies brilliant DXR-HD detector fleet Newest large-size DXR S100 Pro detector in combination with superior pixel resolution defines industry-leading imaging technology: FLASH!TM processed voids in an open µBGA ball: 1,970x geometric zoom for extreme high magnification Exclusive high dynamic DXR250RT detector with enhanced scintillator technology introduces a new industry standard for efficient live inspection: Provides superior 100 μm pixel resolution and frame rates up to 30 frames per second which combines outstanding detectability with high efficiency 300 mm x 250 mm large...

For advanced inspection and 3D analysis of smaller samples, Phoenix|x-ray's proprietary 3D CT technology is optionally available. ■ 180 kV high power X-ray technology, fast image acquisition with DXR detector and Diamond|window combined with Phoenix|x-ray's fast reconstruction software deliver high quality inspection results ■ Maximum voxel resolution down to 2 microns; the nanoCT® capability of the Nanome|x allows even a higher image sharpness Easy 2D slice or 3D volume evaluation of large complex boards No board cutting, no overlaying structures as in X-ray images PlanarCT inspection...

X|act – CAD based inspection: high resolution µAXI for extremely high defect coverage As a solution for µAXI with extremely high defect coverage, Phoenix|x-ray provides its high precision systems Microme|x neo and Nanome|x neo including the unique X|act software package for fast and easy offline CAD programming. Its intuitive new GUI with improved outstanding precision and repeatability, small views with resolutions of only a few micrometers, 360° rotation and oblique viewing up to 70° ensures meeting highest quality standards – even for inspection of components with a pitch of just 100...

Your advantages Phoenix Microme|x and Nanome|x neo ■ Brilliant live inspection images due to high dynamic Waygate Technologies DXR-HD digital detector fleet ■ Unique high power 180 kV / 20 W micro- or nanofocus tube for even high absorbing electronic samples ■ Minimized setup time due to highly efficient automated CAD programming ■ Live overlay of CAD and inspection results even in rotated oblique inspection views ■ Extremely high defect coverage and repeatability ■ Best detail detectability 0.5 pm or even 0.2 pm with nanofocus ■ Optional Flash!ElectronicsTM image processing optimizes...

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