1. Catalogs
  2. Walter Uhl
  3. Optical Measuring System UHL MS5

Optical Measuring System UHL MS5
1 /2Pages

Optical Measuring System UHL MS5

Optical Measuring System UHL MS5
1 /2Pages

Catalog excerpts

Optical Measuring System UHL MS5-1

Optical Measuring System UHL MS5 On the basis of a modular concept the optical measuring system MS5 provides the opportunity to solve different measuring tasks. Technische Mikroskopie

 Open the catalog to page 1
Optical Measuring System UHL MS5-2

Made-To-Measure Metrology Due to its modular basic concept configuration of MS5 can be exactly attuned to customer`s application. Mere incident light application, e.g. topographic measurement or measuring of semiconductor parts do not require transmitted light and open-frame measuring stages. In such cases our cross stage GT9 in closed frame design is applied. Because of its high straightness/flatness and a measuring range of 350x350 mm this measuring stage is suitable for measurements of 12“ wafers - also with two sensors. The open frame stage KT9 (measuring range 420x300 mm) is used for classical...

 Open the catalog to page 2
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.