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Optical Measuring System UHL MS5

Optical Measuring System UHL MS5

Optical Measuring System UHL MS5

Product catalog summary
Overview: The document describes the UHL MS5 optical measuring system, which is based on a modular concept allowing customization for various measuring tasks. It is suitable for both topographic and semiconductor measurements, offering flexibility in configuration to meet specific customer needs.
Specifications: The MS5 system is built on a precision granite and steel pipe frame, with dimensions and weight specified in the document. It operates optimally at a temperature of 20 ± 5° C and requires a power supply of 230 VAC, 50 Hz. The measuring axes include a range of 420 x 300 mm for the KT9 stage and 350 x 350 mm for the GT9 stage, with a Z-axis range of 200 mm and a resolution of 0.1 µm.
Optical Features: The system offers magnification from 50x to 5000x and various illumination options, including transmitted and coaxial incident light, ring light, quadrant ring light, and oblique incident light.
Software Options: The MS5 system supports different software solutions tailored to specific applications. OMS is a user-friendly 2D measuring software for random tests and initial sample inspections. IMS is a fully automated software for serial measurements, and QC5000 provides comprehensive 3D measuring capabilities.
Applications and Customization: The MS5 system can be tailored to specific applications, ensuring that customers only pay for the features they need. It supports a wide range of sensors and microscopes, making it versatile for various optical measuring tasks.
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Catalog excerpts

Optical Measuring System UHL MS5-1

Optical Measuring System UHL MS5 On the basis of a modular concept the optical measuring system MS5 provides the opportunity to solve different measuring tasks. Technische Mikroskopie

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Optical Measuring System UHL MS5-2

Made-To-Measure Metrology Due to its modular basic concept configuration of MS5 can be exactly attuned to customer`s application. Mere incident light application, e.g. topographic measurement or measuring of semiconductor parts do not require transmitted light and open-frame measuring stages. In such cases our cross stage GT9 in closed frame design is applied. Because of its high straightness/flatness and a measuring range of 350x350 mm this measuring stage is suitable for measurements of 12“ wafers - also with two sensors. The open frame stage KT9 (measuring range 420x300 mm) is used for classical...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.