OPTRIX3D
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OPTRIX 3D 2D and 3D Wafer Inspection OPTRIX 3D Wafer Inspection System delivers a comprehensive and flexible AOI solution in your Wafer production up to the final inspection of the frame mounted wafer after taping of the components. With OPTRIX 3D you can perform 2D or 3D inspection tasks. Thanks to OPTRIX 3D's approved patented phase-measuring triangulation technology and over 10 years experience in 3D measurement, the sensor measures not only the x/y dimensions, but also the height for true 3D measurements. The measurement is insensitive to typical surface structure reflectivity and color. Key benefits at a glance: ■ Real 3D bump measurement ■ Combined 2D and 3D inspection ■ Increasing of the quality by early error recognition ■ Avoid customer complains ■ Easy handling of frame mounted Wafer directly of the magazine ■ Latest 8 Megapixel camera ■ Integration into existing process management systems ■ Wafer management software ■ Barcode and DataMatrixCode capability ■ Special solutions possible Technical Description The OPTRIX 3D automated optical inspection (AOI) systems of vision-OS were developed for the highly accurate measurement and inspection of Wafer. Exceptionell reliability, precision and ease-of-use are the results of this development. Due to the fast feedback of the optical inspection, you increase your quality and reduce the customer complaints. VISION Automatic Optical Inspection Systems

Features: ■ Fast inspection cycle for improved performance ■ Extremely low number of false alarms and false accept rates ■ Effective and extremely fast detection of any defect ■ More flexibility with customer-specified inspection criteria ■ Low personnel costs ■ Extremely short startup time ■ Multiple line monitoring for faster responses and more stable processes Additional features: ■ Flexible statistics thanks to customizable SQL queries ■ Integrated editor for flexible programming ■ Quality Monitoring System (QMS) for monitoring multiple lines and communicating to P & P system ■...