Talos
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High-performance chemical analysis in multiple dimensions Precision analysis of nanomaterials. The FEI Talos™ is a Accelerate nanoanalysis for faster answers. Fast image 200kV scanning/transmission electron microscope acquisition in an easy-to-use operation saves time for even (S/TEM) that delivers fast, precise, quantitative less-experienced users. The FEI Talos includes FEI Super-X, characterization of nanomaterials in multiple dimensions. a patented, integrated EDS system with four silicon drift With innovative features designed to increase throughput, detectors (SDDs) for superior sensitivity and mapping precision, and ease of use, FEI Talos is ideal for advanced capabilities of up to 105 spectra/sec. Integration with the research and analysis across academic, government, and A-TWIN objective lens maximizes collection efficiency industrial research environments. while delivering outstanding output count rates for a given High resolution imaging for better-quality data. FEI Talos beam current—even for low intensity EDS signals. combines outstanding high-resolution S/TEM and TEM Make research easier. FEI Talos makes workflow accessible imaging with industry-leading energy dispersive x-ray to a broader community of scientists with a friendly digital spectroscopy (EDS) signal detection and 3D chemical user interface and class-leading ergonomics. The characterization with compositional mapping. The FEI SmartCam high-speed, digital search-and-view camera Velox™ S/TEM engine significantly improves imaging with simplifies application handling. You can also implement full a Drift Corrected Frame Integration (DCFI) engine, four- remote operation for even greater ease of use and channel integration based on multiple STEM detectors, and enhanced environmental immunity. Differential Phase Contrast (DPC) imaging for resolving electro-magnetic structures. Gain high speed and superior accuracy in EDS data processing and quantification applications. The FEI X-FEG high brightness electron source delivers high total current—up to five times the beam current of a standard Schottky FEG—while keeping the convergence angle small. You gain improved signal-to-noise ratio and exceptional image resolution for STEM, EDS, and highresolution TEM applications. Stability and a long lifecycle enable the FEI X-FEG to deliver superior imaging efficiency. See more, faster. Fast TEM imaging on Talos supports high-resolution and in situ dynamic observations. The FEI Ceta 16M™ camera displays a large field of view and captures images at a fast rate of 25 fps, while the piezo stage ensures highly sensitive drift-free imaging and precise sample navigation, saving time and allowing you to capture more data from each sample. KEY BENEFITS Better image data High throughput STEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images Faster time to chemical composition data Rapid, precise quantitative EDS analysis reveals nanoscale details Space for more Add application-specific in situ sample holders for dynamic experiments Increased stability Enhanced environmental immunity with instrument enclosure and remote operation

Features ·· Class-leading optical performance: Constant-power A-TWIN objective lens ·· Maximized ease-of-use: Fast, easy operation switching, fits for multi-user environments ·· Ultra-stable platform: Constantpower objective lens, piezo stage, robust system enclosure, and remote operation ensure maximum stability ·· SmartCam camera: Digital searchand-view camera improves the handling of all applications and allows daylight operation ·· Fully integrated fast detector: Ceta 16Mpixel CMOS camera provides large field of view and high read-out speed (2fps @ 4K and 18 fps @ 1K) ·· Full remote...