Phenom ParticleX TC

Product catalog summary

Product Overview
The Phenom ParticleX TC is a multi-purpose desktop Scanning Electron Microscope (SEM) designed for cleanliness at the microscale. It features a user-friendly interface that allows both new and experienced users to operate the system with minimal training. The system is equipped with a four-segment backscattered electron detector (BSD) and an optional Secondary Electron Detector (SED) for detailed surface imaging.

Elemental Analysis
The integrated Energy Dispersive X-ray (EDX) system provides elemental analysis, allowing users to determine the chemical composition of samples. Elemental Mapping and Line Scan functionalities enable visualization of element distribution and are particularly useful for analyzing coatings and layered materials.

Technical Cleanliness
The Phenom ParticleX TC supports in-house analysis, reducing the need for outsourcing and enabling faster quality control. It is capable of analyzing metal powders and confirming technical cleanliness according to VDA19 or ISO16232 standards.

Imaging Specifications
The microscope offers a magnification range from 80x to 100,000x with a resolution of less than 14 nm. It supports various imaging modes and has a fast sample loading time of less than 40 seconds.

EDX Specifications
The EDX system features a Silicon Drift Detector (SDD) with an active area of 25 mm² and an energy resolution of Mn Kα ≤132 eV. It supports multi-channel analysis and offers various export functions.

System Specifications
The system includes a motorized sample stage, supports sample sizes up to 100 mm x 100 mm, and operates under ambient conditions of 15°C to 30°C with humidity below 80% RH. It requires a single-phase AC power supply and is equipped with a workstation running Windows 10 Enterprise Edition.

Additional Features
The Phenom ParticleX TC is designed for research use and is not intended for diagnostic procedures. It includes pre-installed software for automated image mapping and remote user interface capabilities.

Catalog excerpts

PRODUCT SPECIFICATIONS MICROSCOPE - Phenom ParticleX TC Phenom ParticleX TC Multi-purpose desktop SEM enabling cleanliness at microscale

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SEM image of Zinc-Phosphate on sheet metal SEM image of undesired particle within polymeric matrix A growing number of manufacturing companies are establishing The user interface is based on the proven ease of use technology scanning electron microscopy (SEM) systems in-house. This trend, applied in the successful Phenom desktop SEM products. The from outsourcing to in-house analysis, is growing and the benefits, interface enables both existing and new users to quickly become such as the ability to perform a broad range of automated desktop familiar with the system with a minimum of training....

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User interface ParticleX software Phenom ParticleX - Technical Cleanliness Example of aluminum wear debris Perception - QuickPrint Report Magnification: 2489.81 x Once the data is acquired, Detector: BSD Interlock pressure: N/A With the growing demand for analysis of smaller particles beyond Sample pressure: 4.5E-1 torr Accelerating voltage: 20.0 keV Phenom ParticleX - Technical Cleanliness enables automated Analysis date: 1/3/2018 industry standards or user Scanning Electron Microscopy with EDX Spectrometry. This is specific reports. the scope of light microscopy within (automotive) industries,...

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Imaging Specifications Imaging modes Light optical Electron optical • ilicon Drift Detector (SDD) S Magnification range: 3 - 16x • agnification range: 80 M 100.000x • Digital zoom max. 12x Detector type • Thermoelectrically cooled (LN2 free) Detector active area X-ray window Ultra thin Silicon Nitride (Si3N4) window allowing detection of elements B to Am Light optical Bright field / dark field modes Electron optical • Long lifetime thermionic source (CeB6) Energy resolution • Multiple beam currents Processing capabilities Multi-channel analyzer with 2048 channels at 10 eV/ch Max. input count...

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System Specifications Dimensions & weight Imaging module Diaphragm vacuum pump Power supply Requirements Ambient conditions Temperature Single phase AC 110 - 240 Volt, 50/60 Hz, 300 W (max.) Recommended table size 150 x 75 cm, load rating of 150 kg Workstation Specifications • HP-PC Tower PC • CPU Intel Xeon E5-1620 • RAM 16 GB • SSD 2 x 1TB • USB Keyboard; USB Mouse • Microsoft Windows® 10 Enterprise Edition (64-bit) • ParticleX Software pre-installed, full license code included • ProSuite Framework pre-installed, full license code included- Automated Image

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Find out more at thermofisher.com/phenom-particle-x-tc For Research Use Only. Not for use in diagnostic procedures. © 2019 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific and its subsidiaries unless otherwise specified. DS0293-EN-07-2019

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Phenom ParticleX TC

Phenom ParticleX TC

Catalog excerpts

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