Instrumentation for surface analysis Surface chemistry and thin film characterization Thermo Fisher SCIENTIFIC

X-ray photoelectron spectroscopy Quantitative, chemical identification of the surface X-ray Photoelectron Spectroscopy (XPS, also known as Electron Spectroscopy for Chemical Analysis – ESCA) is a highly surface-sensitive, quantitative, chemical analysis technique that can be used to solve a wide range of materials problems. XPS is the measurement of photoelectrons ejected from Solar Cells the surface of a material which has been irradiated with X-rays. The kinetic energy of the emitted photoelectrons Powders is measured, which is directly related to their binding energy within the parent atom;...

Nexsa G2 XPS System Unique correlative spectroscopy The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in...

ESCALAB QXi XPS Microprobe Performance and versatility The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our • High-resolution, quantitative XPS imaging for smallest feature analysis renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as • High-performance spectroscopy an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by • Ion source for depth profiling the powerful Thermo Scientific Avantage Data System for surface analysis....

K-Alpha XPS System Designed for productivity The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio. • High-performance, fully featured XPS system • Unique sample viewing with capability to facilitate rapid...

MAGCIS Dual Beam Ion Source Monatomic and gas cluster ion source option for Thermo Scientific XPS spectrometers Analysis and surface cleaning of both soft and hard materials on the same XPS Electrical Connections instrument. Switching between gas cluster sputtering and monatomic sputtering is handled completely by Avantage Data System, and can be done in a matter of seconds. Gas cluster ion depth profiling opens up a variety of applications: investigate oil-resistant coatings on touch screens, measure plasma deposited coatings for biomedical Ionization Region devices, or characterize OLEDs and...

Avantage Data System The premier software for surface analysis The most crucial component of a modern XPS instrument is its software, which handles all aspects of operation, data interpretation and reporting. All Thermo Scientific XPS Atomic Concentration (%) systems use Thermo Scientific Avantage Data System for instrument control, data processing, and reporting. Whether working in a dedicated research lab or in a multi- user environment, analysts of all abilities can rely on the flexibility, feature-set, and intuitive operation of Avantage Data System to obtain the maximum information from...

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The full spectrum of surface analysis Use our Product Selector Tool to quickly find your ideal instrument: thermofisher.com/xps-product-selector Thermo Fisher SCIENTIFIC Find out more at thermofisher.com/xps For research use only. Not for use in diagnostic procedures. For current certifications, visit thermofisher.com/certifications © 2021 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific and its subsidiaries unless otherwise specified