Thermo Fisher ChemiSEM Technology SEM and EDS for materials characterization thermo scientific

Insert chemistry into the heart of your SEM workflow As materials research continues to advance, more and more researchers have begun using scanning electron microscopes (SEMs) for compositional analysis, and manufacturers have responded by equipping most SEMs with energy dispersive X-ray detectors (EDS). However, traditional EDS detectors are often purchased as separate systems, leaving some with disparate hardware and software solutions. Thermo Scientific™ ChemiSEM™ Technology revolutionizes and simplifies EDS analysis by fully integrating SEM and EDS functions into a single, cohesive user...

Quantification Modes Mapping ChemiView Support About us Benefits of ChemiSEM Technology Always on — Eliminate the need to move from SEM imaging to EDS analysis for each sample. ChemiSEM is always on and continuously collects the EDS signal during SEM imaging, collecting a full EDS spectrum at every point in the image. Faster data acquisition—Access elemental information much faster than conventional techniques with novel data segmentation approaches based on machine learning, ultrafast signal processing, and the tightest possible SEM EDS integration. Reliable results—Get accurate qualification...

Mapping ChemiView Support About us Using ChemiSEM Technology A seamless SEM-EDS workflow ChemiSEM Technology was built from the bottom up to provide full control over all SEM and EDS functions within a single user interface. Experiment setup, image processing, and spectral analysis functions are intuitively grouped, making data management straightforward. And the system features a quadrant format and project tree to highlight the most important data. A. View your sample B. Switch between quantitative maps, count maps, and phase distribution maps C. Generate a full-color overlay from any number...

Live chemical analysis ChemiSEM Technology provides live compositional information during routine SEM navigation and imaging. Proprietary electron and X-ray data processing algorithms make ChemiSEM Technology incredibly fast. ChemiSEM works on a statistical basis, assigning segments, or superpixels, to the image which progressively shrink as data continues to arrive. This process ultimately converges on a pixel-precise EDS map, allowing the user to perform both rapid sample navigation and detailed quantitative analysis without switching setup parameters. For specimens where limited contrast is...

Large area montage Thanks to its full integration in the SEM user interface, ChemiSEM Technology can help you acquire large-scale images. Such overviews are available through the native image montage creation, which automates acquisition over large areas. Navigation montage automatically collects multiple neighboring images while collecting the EDS signal for each frame. The EDS signal is then processed to provide quantitative information, and the resulting lowmagnification images provide a large-scale overview of the sample in a short period of time. Navigation montage can be used as an effective...

Mapping ChemiView Support Quantitative analysis ChemiSEM Technology incorporates innovative algorithmic approaches, smart spectral fitting, and optimized matrix correction routines to facilitate accurate and precise quantification, even in the presence of multiple overlapping elements. Spectrum Clean ChemiSEM Spectrum Clean removes sum and escape peak artifacts when two X-ray beams arrive near simultaneously and are detected as a single event. Because their occurrence is on a statistical basis, they are more prevalent at higher count rates. On other systems, the sum peak removal processes can...

Spectrum simulation Spectrum simulation automatically validates elemental identification and quantification based on your exact microscope settings, providing total confidence in your analytical results. Background and synthetic spectra consider your exact accelerating voltage, working distance, and beam current and can be run live or to any Intensity (counts) previously acquired spectrum. O Ceramic (7 786 984 counts) Background spectrum Synthetic spectrum Intensity (counts) Background spectrum Synthetic spectrum Intensity (counts) Geological section (879 643 counts) Malachite (4 401 106 counts)...

ChemiView Support Modes of analysis ChemiSEM Technology enables easy switching between point mode, linescan, and X-ray mapping to help you better understand the specimen story. Full elemental information at any point or region on the electron image: • Define and analyze any area in the electron image, from a single point to larger areas • Analyze regions instantly using a survey mode or toggle to a sequenced acquisition for an unlimited number of points or areas • Easily overlay a point's spectrum to compare different areas • Save acquisition parameters (time or number of counts) as presets •...

ChemiView Support Linescan mode Chart compositional changes across your sample: • Seamlessly switch between net counts, atomic%, and weight% • Easily overlay different linescans to compare different areas and obtain elemental ratios • Save acquisition parameters (time, number of counts, or number of points) as presets in the user interface • Choose between single or multiple passes over the line Figure 9. Geological cross section showing a silica particle within an iron sulfide cluster. The definition of parameters, acquisition of the line, and visualization of the elements and elemental profiles...

Mapping X-ray maps are available both live during the acquisition and offline after the acquisition is completed. ChemiSEM Technology stores a spectrum at every pixel, yielding data that can be analyzed repeatedly without the need to re-acquire or re-create acquisition parameters. 1 Live peak deconvolution ChemiSEM maps include a sophisticated background removal algorithm. Any peak overlaps are deconvoluted and assigned using least squares fitting based on a library of peak shapes. In the net counts realm, ChemiSEM Quantitative Mapping makes evaluating complex sample With conventional mapping,...