Signal Integrity Studio • Seamless integration with LeCroy SPARQ™ S-parameter • Full signal integrity analysis of equalized receiver signal • Advanced jitter analysis and/or modeled network • Available as standalone software option installed on a LeCroy Signal Integrity Studio enhances the modeling and simulation capabilities of the LeCroy SPARQ application, adding eye and jitter measurements. End-to-end Signal Integrity Workstation Signal Integrity Studio combines S-parameter measurements, channel and equalizer modeling and eye diagramming and jitter analysis in a single affordable software package. "SI Studio" is available as a standalone version or as an option for a LeCroy SPARQ series network analyzer. With Signal Integrity Studio, users analyze the effects that impedance mismatches, losses, emphasis and equalization choices have on signal integrity characteristics of a device under test. S-parameters measured from an imported Touchstone file are used to emulate or de-embed a channel. Models for emphasis and equalization and a simulated waveform are configured by the user, and the resulting eye diagram can be viewed and analyzed to provide insight into the eye closure and jitter characteristics of the visit www.LeCroy.com/SIStudio

FROM MEASUREMENT TO SIMULATION LBOIAI lAIEVSnBEIAIEI/li 10 SIIAlnrV±IOI/l See Effects of Measured S-parameters Immediately Signal Integrity Studio works seamlessly with the SPARQ Series Signal Integrity Network Analyzers. S-parameters measured live by the SPARQ link directly to user's configuration for channel and fixture emulation or de-embedding configuration. As the SPARQ acquires new S-parameters, the application rapidly shows the affect of the newly acquired measurements. The SPARQ measures 40 GHz S-parameters with single button press operation at a fraction of the price of a VNA, and is...

Determine Optimal Equalizer Settings Users can open up closed eyes via a simple GUI for configuring pre-emphasis, de-emphasis, continuous time linear equalization (CTLE), feed forward equalization (FFE) or decision feedback equalization (DFE) filters, and standard or customizable PLL settings. Users can configure settings manually, or allow the software to configure automatically. Training Controls _ Auto Find Upper Level # Pre curs or Taps Decision Level Lower Level Equalizer and pre/de-emphasis (not shown) are easily modeled via SI Studio's "EyeDoctor II" dialogs. Rapidly Measure Eye Diagrams...

ORDERING INFORMATION AND FEATURES Standalone Operation Customers who purchase either SPARQ-SISTUDIO or SISTUDIO can access Signal Integrity Studio capabilities via a USB license key that ships with each order. Users can make measurements with the SPARQ, and then use the application software with its Studio features while "untethered" from the SPARQ. This mode of operation allows users to recalculate their S-parameters and re-analyze eye and jitter characteristics without the SPARQ hardware. Standalone operation is a new feature, released with SPARQ software version 6.5.0.5. Ordering Information...