IA-DJ
17Pages

DALSA IA-DJ High Quanta Imaging Sensor Features Front illuminated full-frame CCD High QE response 24 μm × 24 μm pixel size 524×524, 1044×1044, or 2084×2084 pixel resolution Low dark current (< 15 pA/cm2 @ 25 °C) Dark signal noise <1 e- / pixel per second at -16 °C Single output, up to 10 MHz data rate 1×1, 2×2, or 4×4 binning modes High speed Area of Interest (AOI) mode ~100% fill factor (approx.) Photo-sensitive readout registers for real-time exposure monitoring Description The IA-DJ High Quanta full-frame CCD sensors are designed to meet the requirements of scientific and x-ray applications demanding high sensitivity, high frame rates and low noise performance. The High Quanta series of sensors aims to provide the highest quantum efficiency in a front-illuminated sensor. Sensor Block Diagram 4 Dark IA-DJ Imaging Area N (H) x N (V) 24 x 24 μm HCCD - N Active Pixels 4 Dark 4 Inactive

DALSA IA-DJ High Quanta Imaging Sensor Gate Structure Diagram The shaded region represents the non-imaging region PIXELS (N x N) Functional Description The IA-DJ sensors are composed of three main functional groups: photo pixels, in which the charge packets are generated, CCD readout shift registers, and output amplifiers where the charge packets are converted to voltage pulses. Detection The IA-DJ sensors are available in 524 × 524, 1044 × 1044, 2084 × 2084 pixel resolutions. The pixels are 24 × 24 μm in size. Light incident on these pixels is converted into charge packets whose size (i.e....

DALSA IA-DJ High Quanta Imaging Sensor Sensor Architecture Image Section Active Image Aspect Ratio Pixel width × height Pixel Optical Fill Factor Number of active lines Number of dark lines Total number of lines No. of active pixels per line No. of dark + inactive pixels per line Total No. of pixels per line Output Amplifier No. Output Amplifier Load Current Sensor Pinout Signal Name CI1 CI2 CILAST VBB VGR VVD VDC CR1 CR2 CRLAST VSET RST VSS VOD VDD OS Output Section 2 stage source follower 1 External Signal Description Vertical CCD Clock - Phase 1 Vertical CCD Clock - Phase 2 Last Vertical...

DALSA IA-DJ High Quanta Imaging Sensor Power Sequencing Power On 1 VBB 2 VSS 3 VOD 4 RST 5 Rest of biases POWER OFF: Reverse sequence of POWER ON. IA-DJ-2084 Pinout Drawing

Additional Performance Specifications Parameter Full Well Capacity1 (Ne-sat) Charge Conversion Efficiency (CCE) RMS noise2 Dynamic range3 Charge Transfer Efficiency (CTE) Dark current density4 (Jd) Dark current doubling temp Wavelength at peak responsivity Peak responsivity QE OS Linearity5 Anti-blooming Notes: 1. VOD and RST DC biases can be adjusted to increase the Ne-sat. OS linearity may suffer near 200 Ke- Ne-sat. 2. Noise floor of the CCD Amplifier assuming correlated double sampling, data rate = 5 MHz, temperature = 20°C, bandwidth = 17 MHz. 3. 20LOG(Ne-sat/RMS Noise) using typical...

DALSA IA-DJ High Quanta Imaging Sensor Responsivity and QE Graph IA-DJ Spectral Responsivity & Quantum Efficiency Responsivity Q.E. Quantum Efficiency (%) Dark Current Graph IA-DJ Dark Current Density vs Package Temperature Jdark (pA/cm )

DALSA IA-DJ High Quanta Imaging Sensor Cosmetic Specification IA-DJ-00524 Grade Point Defect Point Defect Test Grade Sensors Test grade sensors may be available, by request. Test grade sensors are functional sensors provided for engineering development purposes only. These sensors have an unspecified number of cosmetic defects and may not meet all sensor specifications. Not all parameters may be tested. Defect Description General: An exclusion zone consisting of the outside two rows and columns on all sides are excluded from defect calculations Specification apply at 25°C ambient Deviations...

DALSA IA-DJ High Quanta Imaging Sensor Column Defect: • A grouping of more than 10 single pixel defects along a single column • A column that does not exhibit the minimum charge capacity specification (Low charge capacity) • A column that loses >500 electrons when the array is illuminated to a signal level of 2000 electrons/pix. (Trap like defect) • Column defects are separated by at least 5 pixels from other column defects Operation Absolute Maximum Rating Min Max Storage Temp -20 °C 80 °C Operating Temp -20 °C 60 °C Voltage on CI1, CI2, CILAST, VDC, CR1, CR2 with respect to VBB -10 V 18 V...

DALSA IA-DJ High Quanta Imaging Sensor DC Operating Conditions Symbol Description Unit Min. Rec. Max ILOAD Load current to the output (OS) mA 2.0 3.0 5.0 VDD Amplifier Supply V 16.5 17.0 17.5 VOD Output reset drain V 15.0 15.5 16.0 VSET Output node set gate V 1.0 2.0 2.0 VVD AOI Drain V 10.0 12.0 14.0 VSS1 Amplifier Return V 2.0 2.0 2.5 VBB1 Substrate V 0 0 0 VGR Guard Ring V 9.0 10.0 14.0 Note: 1. VBB should never be forward biased with respect to VSS. To protect against damage, a Schottky diode between VBB and VSS is recommended AC Operating Conditions Symbol Description CIx All CIx...

DALSA IA-DJ High Quanta Imaging Sensor IA-DJ-01044 Frame Rate Binning Mode Data Rate (MHz) No binning 5 2×2 5 4×4 5 IA-DJ-02084 Frame Rate Binning Mode Data Rate (MHz) CR Clock1 (MHz) No binning 5 5 2×2 5 10 4×4 5 20* Notes: 1. CRLAST needs to be maintained at Data Rate for proper binning. 2. Zero integration time, max frame rate. Overclock pixel = 20. 3. This is the maximum allowed HCCD clock rate. Timing Parameters Symbol Description t1 CI1 duration t2 CI2 duration t3 CI1/CI2 overlap t4 HCCD setup time t5 HCCD period (no binning) t6 RST pulse duration (FWHM)2 t7 Overclock pixels t8 HCCD...

DALSA IA-DJ High Quanta Imaging Sensor IA-DJ-02084 Line Timing (No binning) t4 t7 t1 CI1 Line Timing (4 × 4 binning) t1

DALSA IA-DJ High Quanta Imaging Sensor Detailed Readout Register Timing (no binning) t10 IA-DJ-02084 AOI Charge Dump IA-DJ sensors have an AOI feature that allows charge dumping of unwanted lines into a charge drain until the desired line is reached. This allows for faster AOI readout. The charge dumping can be initiated by clocking the VDC gate. Last line dump First valid line transfer Line Dump *NOTE: CRs can be clocked during charge dumping to reduce accumulated dark signal on HCCD.