Surtronic 25 Parameter Options to suit your application The Surtronic 25 can calculate up to 10 parameters according to your measurement application: Amplitude Parameters (measures the vertical characteristics of the surface deviations): Ra (Arithmetic Mean Deviation) Rsk (Skewness) Rz (Average peak to valley height) Rt (Total height of profile) Rp (Max profile peak height) Rz1max (Max peak to valley height) Spacing Parameters (measures the horizontal characteristics of the surface deviations): RPc (Peak count) RSm (Mean width of profile elements) Hybrid Parameters (combinations of spacing and...

3 Unique Stylus Lift Mechanism The Surtronic 25 has a uniquely engineered stylus lift mechanism which allows a vertical adjustment of 50mm and rotation of the pick-up to different measuring positions, including right angle or inverted measurements. These adjustments to the height and position of the gauge allow areas and features of a part to be easily measured without additional complex fixturing. This feature saves the operator a huge amount of set up time and allows total flexibility. Typical applications where the stylus lift is invaluable include the measurement of steps, bores, grooves...

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