SXS2154HC1D SXS3474HC1D
2Pages

{{requestButtons}}

Catalog excerpts

SXS2154HC1D SXS3474HC1D - 2

New X-ray Sensor Relative mass inspection with high stability *1 X-ray Seal Inspection System For packaged products SXS2154HC1D / SXS3474HC1D Various packing materials Sample product to be inspected Dressing in a small bag High sensitivity Stable relative mass inspection*1 achieved! A model with a new X-ray sensor. Suitable for a lightweight and large number of products such as individually-packaged ones. With this system, you can stably make a high-speed relative mass inspection which cannot be made with an auto checker *1. Comparison of dispersion in a relative mass inspection Reference...

Open the catalog to page 2

All SYSTEM SQUARE Inc. catalogs and technical brochures