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Microscopy Systems
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Microscopy Systems - 1

Microscopy Measurement Systems Capture micro surface images along with optical properties for spectral reflectance color and absorbance spectroscopy Digital Microscope attaches to PC via USB Adjustable magnification to 220x or 400x Adjustable focus with integrated LED illumination Portable weight 155g, 10.5cm (H) x 3.2cm (Dia) Extremely rugged with no moving parts Shock-proof durability and permanent alignment Miniature size, low cost, portable instrumentation Integrated with StellarNet fiber optic spectrometers Includes adjustable stand with spectroscopy lamp 2 year warranty with digital microscope • • • • • • • • • • Microscopy Applications • • • • • • • • • • • Material microstructure & surface analysis Biology - anatomy of cells, parasites, life Biotechnology and medical Paper printing, art, legal tender Forensics crime lab study Food & Agriculture Entomology and insects Minerals & Gemology diamonds, gem stones Metallurgical alloys, coins, industrial Semi-conductor and solar cell Composite fabrics, fibers, textiles Versatility with Fiber Optic • • • • • For use in the lab, in the field, on-line, or at-line on the production floor Color monitoring and measurement Quality Control of incoming raw materials or finished products Little to no sample prep needed! Portability- optional instrument case holds spectrometer and microscope +1-813-855-8687 • www.StellarNet-Inc.com

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Microscopy Systems - 2

Microscopy Measurement Systems SpectraWiz Spectroscopy Software • Color measurements provide CIELAB values o o o o o o o o L*: Brightness (0 to 100) a*: Green (-a) to Red (+a) b*: Blue (-b) to Yellow (+b) Delta E* color difference X Y Z tristimulus xy chromaticity chroma hue + Compare samples to saved color standards + Sample color values can be saved to text file • • • • Characterize sample material spectral reflectance Characterize sample material spectral absorbance Analyzer development kit allows model development for concentration measurement using UV-VIS or NIR spectrometers. See ADK...

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