Gated Integrators and Boxcar Averagers SR200 — Variable rate gate scanner · Gate scanner for SR250 and SR255 · Forward/reverse scans · Repeat/single-shot scans · Pen lift output · Scan times from 10 ms to 5 minutes · Variable scan width control SR200 Gate Scanner The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 gated integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage needed to scan the gates using these inputs. The initial and final delays, as well as the scan time, are fully adjustable. Single or repeated scans may be performed in the forward or reverse direction over any portion of the waveform. Scan times from 10 milliseconds to 5 minutes may be selected. In addition to the delay control output, the SR200 has a 0 to 10 V X-axis ramp output designed to drive the X-axis of a chart recorder or an oscilloscope. Gate scanner Stanford Research Systems SR200 Specifications Reverse/Stop/Forward Single/Reset/Repeat Scan time Start position Scan width Control voltage Pen lift X-Axis Power supplies Warranty Selects scan direction or stops scan Selects type of scans or resets to start 0.01 to 300 s 10-turn pot sets the smallest delay multiplier (SR250) in the scan 10-turn pot sets the range of delay multipliers (SR250) in the scan Rear-panel output connects to the SR250/SR255 delay multiplier input. Impedance <1 Ω, 20 mA Logic signal to lift chart recorder pen or blank an oscilloscope trace Scans from 0 to 10 VDC regardless of start position and scan width settings +24 V/20 mA, +12 V/80 mA, –12 V/0 mA, –24 V/20 mA. 2 W One year parts and labor on defects in materials and workmanship