Atomic Force Microscope

Product catalog summary

Overview
This document provides detailed specifications and comparisons for Atomic Force Microscopes (AFM) offered by OME, highlighting their compact, reliable, and affordable solutions for nano-scale applications.

Specifications

Models: CrabiAFM-E-01 and CrabiAFM-A-01
DAC/ADC Bits: Both models feature 12 bits.
Max. Scan Range: 10 µm for both models.
Max. Scan Height: 2.5 µm for CrabiAFM-E-01 and 1.4 µm for CrabiAFM-A-01.
Scan Speed: Greater than 1 Hz for CrabiAFM-E-01 and greater than 2 Hz for CrabiAFM-A-01.
Z Resolution: 10 nm for CrabiAFM-E-01 and 0.35 nm for CrabiAFM-A-01.
Spectroscopy Modes: Force-distance for both models.
Max. Sample Size/Height: 12 mm/4 mm for both models.
Max. Sample Positioning Range: 12 mm in XY for both models.
Top Image: Optional for CrabiAFM-E-01 and available for CrabiAFM-A-01.
Size: 110x110x67 mm for both models.
XY Resolution: 5 nm for CrabiAFM-E-01 and 2.5 nm for CrabiAFM-A-01.
Approach: Auto/6 mm for both models.
Image Modes: AC mode, Amplitude error, Phase (optional for CrabiAFM-E-01).

Comparison

Max. Scan Range: 70 µm vs. 10 µm.
Max. Scan Height: 14 µm vs. 2.5 µm.
Z Resolution: 0.2 nm vs. 0.02 nm.
Spectroscopy Modes: Force-distance, Amplitude-distance (optional).
Max. Sample Size/Height: 12 mm/3.5 mm vs. 10 mm/3.5 mm.
XY Resolution: 1 nm vs. 0.15 nm.
Approach: Auto 4 mm vs. Auto 5 mm.

Additional Functions

Imaging Modes: N-brand includes AC mode, DC mode, Amplitude error, Phase, MFM (optional), EFM (optional). B-brand includes additional modes like KPFM, PeakForce, LFM.
Software Differences: MFM is not available in N-brand, while B-brand offers additional features like setting scanning area angle and image display color settings.

Contact Information
OME can be contacted via phone at +886-2-26716600 or email at [email protected]. Their address is No. 46, Lane 168, Sanshu Rd., Sanxia Dist., New Taipei City 237, Taiwan.

Catalog excerpts

Driving You to the Nano World! 原子力顯微鏡 Atomic Force Microscope Material MEMS detection Film thickness Standard sample Nano particles

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Compact, Reliable, Affordable, Best solution, and Innovative Atomic Force Microscope Functions 1 Expandable in the future 2 Optional *Core technology patent applying SpecificationsComparison Contact TEL: +886-2-26716600 / FAX: +886-2-26711400 E-mail: [email protected] No. 46, Lane 168, Sanshu Rd., Sanxia Dist., New Taipei City 237, Taiwan Technology Co.,Ltd. www.ome.com.tw ■

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.

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