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Driving You to the Nano World! 原 子力 顯微鏡 Atomic Force Microscope Material MEMS detection Film thickness Standard sample Nano particles
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Compact, Reliable, Affordable, Best solution, and Innovative Atomic Force Microscope Functions 1 Expandable in the future 2 Optional *Core technology patent applying SpecificationsComparison Contact TEL: +886-2-26716600 / FAX: +886-2-26711400 E-mail: nano@staf.com.tw No. 46, Lane 168, Sanshu Rd., Sanxia Dist., New Taipei City 237, Taiwan Technology Co.,Ltd. www.ome.com.tw ■
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