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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB

Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB
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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB

Product catalog summary
Overview: The CXK77K18R320GB is a high-speed CMOS synchronous static RAM by Sony, organized as 2,097,152 words by 18 bits. It integrates input registers, high-speed RAM, output registers, and a one-deep write buffer on a single IC, supporting Register-Register (R-R) read operations and Late Write (LW) write operations.
Specifications:
  • Operates at 333 MHz with a single 1.8V power supply.
  • Supports 3 speed bins with cycle times of 3.0ns, 3.3ns, and 4.0ns.
  • Features HSTL-compatible I/O interface and programmable output driver impedance.
  • Includes JTAG boundary scan interface using IEEE standard 1149.1 protocol.
Pin Configuration: The device uses a 119-pin Ball Grid Array (BGA) package. Key pins include synchronous address inputs (SA), data inputs/outputs (DQa, DQb), differential input clocks (K, K), and asynchronous output enable (G).
Operating Modes:
  • Read and write operations are synchronized with the rising edge of the K clock.
  • Sleep mode is activated via the ZZ input, preserving memory contents while reducing power consumption.
  • Output driver impedance is programmable and controlled by an external resistor connected to the ZQ pin.
Electrical Characteristics:
  • Supply voltage ranges from 1.7V to 1.9V, with output supply voltage from 1.4V to VDD.
  • Input and output leakage currents are specified, with typical operating current at 650 mA for the fastest speed bin.
  • AC characteristics include input cycle time, clock pulse widths, and setup/hold times for various signals.
Power-Up and Impedance Requirements: The power-up sequence should follow VSS, VDD, VDDQ, VREF, and inputs. Output driver impedance stabilizes within 8192 cycles after power-up.
Absolute Maximum Ratings: The device can withstand supply voltages up to 2.5V and storage temperatures from -55°C to 150°C. Operating temperature ranges from 0°C to 85°C.
AC Test Conditions: Test conditions are specified for VDDQ at 1.5V and 1.8V, with detailed input and output voltage levels and load conditions.
Timing Diagrams: The document includes timing diagrams for read-write-read operations, both synchronously and asynchronously controlled, illustrating the transitions between operations.
Sleep Mode Timing: The Sleep (Power-Down) Mode Timing Diagram outlines the sequence of operations required to enter and exit sleep mode. Key points include the necessity of initiating two Deselect operations before asserting ZZ and ensuring recovery time (tZZR) is met before resuming Read/Write operations.
JTAG Test Mode: The JTAG interface includes a TAP Controller and four TAP Registers (Instruction, ID, Bypass, and Boundary Scan Registers). The TAP Controller is a 16-state machine controlling access to these registers. The document specifies the JTAG DC and AC operating conditions, including input/output voltage levels and timing parameters.
TAP Registers: The Instruction Register is 3 bits wide, storing TAP instructions. The Bypass Register is 1 bit wide, providing a minimal serial path. The ID Register is 32 bits wide, containing device-specific identification codes. The Boundary Scan Register is 51 bits wide, capturing the logic states of the SRAM's I/O ring.
Ordering Information: The document lists different part numbers with their respective speed and cycle times. The CXK77K18R320GB is available in various speed grades, with cycle times ranging from 3.0ns to 4.0ns.
Package Information: The device is packaged in a 119-pin BGA format, with specific dimensions and material details provided. The package contains lead (Pb), which may be subject to environmental regulations.
Revision History: The document includes a detailed revision history, noting changes in specifications, electrical characteristics, and package dimensions over time.
Capacitance Specifications:
  • CIN: 3.5pF to 4.0pF
  • CKIN: 3.5pF to 4.5pF
  • COUT: 4.5pF to 5.0pF
AC Electrical Characteristics Modifications:
  • tKHQV: Changed from 1.5ns to 1.6ns
  • tKHQZ: Changed from 1.7ns to 1.8ns
Package Dimensions:
  • Added a note regarding lead content in solder balls.
Revision Information:
  • Revision 0.8 dated December 8, 2004, includes modifications to AC Electrical Characteristics and additional notes.
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Catalog excerpts

Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-1

32Mb LW R-R HSTL High Speed Synchronous SRAM (2Mb x 18) The CXK77K18R320GB is a high speed CMOS synchronous static RAM with common I/O pins, organized as 2,097,152 wordsby 18 bits. This synchronous SRAMs integrates input registers, high speed RAM, output registers, and a one-deep write buffer onto a single monolithic IC. Register - Register (R-R) read operations and Late Write (LW) write operations are supported, pro-viding a high-performance user interface. All address and control input signals except G (Output Enable) and ZZ (Sleep Mode) are registered on the rising edge of the Kdifferential input clock. During read operations, output data is driven valid from the rising edge of K, one full clock cycle after the address is registered.During write operations, input data is registered on the rising edge of K, one full clock cycle after the address is registered.Sleep (power down) capability is provided via the ZZ input signal. Output drivers are series terminated, and output impedance is programmable via the ZQ input pin. By connecting an externalcontrol resistor RQ between ZQ and V > SS , the impedance of the output drivers can be precisely controlled.333 MHz operation is obtained from a single 1.8V power supply. JTAG boundary scan interface is provided using a subset ofIEEE standard 1149.1 protocol. > 3 Speed Bins Cycle Time / Access Time -3 3.0ns / 1.6ns-33 3.3ns / 1.6ns -4 4.0ns / 2.0ns?Single 1.8V power supply (V > DD ): 1.8V ձ 0.1V Note : 2.5V V > DD is also supported. Please contact Sony Memory Marketing Department for further information.?Dedicated output supply voltage (V > DDQ ): 1.5V to 1.8V typical?HSTL-compatible I/O interface with dedicated input reference voltage (V > REF ): V > DDQ /2 typical?Register - Register (R-R) read protocol?Late Write (LW) write protocol?Full read/write coherency ?Byte Write capability?Differential input clocks (K/K )?Asynchronous output enable (G )?Sleep (power down) mode via dedicated mode pin (ZZ)?Programmable output driver impedance?JTAG boundary scan (subset of IEEE standard 1149.1) ?119 pin (7x17), 1.27mm pitch, 14mm x 22mm Ball Grid Array (BGA) package > 32Mb LW R-R, rev 0.81 / 23December 8, 2004 size="-1">

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-2

DDQ SASANCSASAV > DDQ BNCSASASA(32M)SASANCCNCSASAV > DD SASANCDDQbNCV > SS ZQV > SS DQaNCENCDQbV > SS SS V > SS NCDQaFV > DDQ NCV > SS G V > SS DQaV > DDQ GNCDQbSBW bNCV > SS NCDQaHDQbNCV > SS NCV > SS DQaNCJV > DDQ V > DD V > REF V > DD V > REF V > DD V > DDQ KNCDQbV > SS KV > SS NCDQaLDQbNCV > SS K SBW aDQaNCMV > DDQ DQbV > SS SW V > SS NCV > DDQ NDQbNCV > SS SAV > SS DQaNCPNCDQbV > SS SAV > SS NCDQaRNCSAM1 > (1) V > (2) DD M2 SANCTNCSA(x18)SANC(x36)SASA(x18)ZZUV > (3) DDQ TMSTDITCKTDORSVD V > DDQ Notes :1. Pad Location 3R is defined as an M1 mode pin in LW SRAMs. However, it must be tied Γlow...

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-4

x(t (t OperationDQ(t > n )SW (t > n )SBW > n )G > n )DQ(t > n+1 )X1XXXXSleep (Power Down) ModeHi - ZHi - Z ↑ 01XXXDeselect***Hi - Z ↑ 001X1ReadHi - ZHi - Z ↑ 001X0Read***Q(t > n ) ↑ 0000XWrite All Bytes***D(t > n ) ↑ 000XXWrite Bytes With SBW x = 0***D(t > n ) ↑ 0001XAbort Write***Hi - Z Notes: 1.1Ӕ = input highӔ; 0Ӕ = input lowӔ; XӔ = input donӒt care.2. ԓ*** indicates that the input requirement or output state is determined by the previous operation.3.DQs are tri-stated in response to Write and Deselect commands, one cycle after the command is sampled. > Sleep (power down) mode is provided...

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-6

(V > o SS = 0V, T > A = 0 to 85 C) > DD 1.71.81.9V1Output Supply VoltageV > DDQ 1.4---V > DD VInput Reference VoltageV > REF V > DDQ /2 - 0.1V > DDQ /2V > DDQ /2 + 0.1V2Input High Voltage (Address, Control, Data)V > IH V > REF + 0.1---V > DDQ + 0.3V3Input Low Voltage (Address, Control, Data)V > IL -0.3---V > REF - 0.1V4Input High Voltage (M1, M2)V > MIH V > REF + 0.3---V > DD + 0.3VInput Low Voltage (M1, M2)V > MIL -0.3---V > REF - 0.3VClock Input Signal VoltageV > KIN -0.3---V > DDQ + 0.3VClock Input Differential VoltageV > DIF 0.2---V > DDQ + 0.6VClock Input Common Mode VoltageV > CM V > DDQ...

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-7

(V > o DD = 1.8V α 0.1V, V > SS = 0V, T > A = 0 to 85 C) > LI V > IN = V > SS to V > DDQ -5---5uAInput Leakage Current (M1, M2)I > MLI V > MIN = V > SS to V > DD -5---5uAOutput Leakage CurrentI V > OUT = V > SS to V > DDQ LO -5---5uAAverage Power Supply Operating CurrentI G = V > IH DD-3 I = 0 mASS ------ --------- ---650600 540mAPower SupplyStandby CurrentI I > OUT DD-33 I > DD-4 = V > IL , ZZ = V > IL I > OUT = 0 mAZZ = V > SB ------180mA1Output High VoltageV > IH I > OH = -6.0 mARQ = 250 > OH V - 0.4------VOutput Low VoltageV Ω > DDQ I > OL = 6.0 mARQ = 250 > OL ------0.4VOutput Driver ImpedanceR...

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-9

ItemSymbolConditionsUnitsNotesInput Reference VoltageV > REF 0.75VInput High LevelV > IH 1.25VInput Low LevelV > IL 0.25VInput Rise & Fall Time2.0V/nsInput Reference Level0.75V Clock Input High VoltageV > KIH 1.25VV > DIF = 1.0VClock Input Low VoltageV > KIL 0.25VV > DIF = 1.0VClock Input Common Mode VoltageV > CM 0.75VClock Input Rise & Fall Time2.0V/nsClock Input Reference LevelK/K crossVOutput Reference Level0.75VOutput Load ConditionsRQ = 250 Ω See Figure 1below >

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-10

ItemSymbolConditionsUnitsNotesInput Reference VoltageV > REF 0.9VInput High LevelV > IH 1.4VInput Low LevelV > IL 0.4VInput Rise & Fall Time2.0V/nsInput Reference Level0.9V Clock Input High VoltageV > KIH 1.4VV > DIF = 1.0VClock Input Low VoltageV > KIL 0.4VV > DIF = 1.0VClock Input Common Mode VoltageV > CM 0.9VClock Input Rise & Fall Time2.0V/nsClock Input Reference LevelK/K crossVOutput Reference Level0.9VOutput Load ConditionsRQ = 250 ТĦ See Figure 2below >

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Ultra-High-Speed Synchronous SRAMs CXK77K18R320GB-12

DummyDummy ReadReadReadReadReadWriteWriteWriteReadRead Read > t > KHKH t > KHKL t > KLKH t > AVKH t > KHAX IL t > WVKH t > KHWX t > WVKH t > KHWX t > GLQV t > GHQZ t > GLQX t > KHQV t > KHQX t > KHQZ t > DVKH t > KHDX t > KHQX1

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