SIOS products
1 /32Pages

SIOS products

SIOS products
1 /32Pages

Catalog excerpts

SIOS products-2

PRECISION IN MEASUREMENT Length • Angle • Straightness • Vibration • Temperatur

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SIOS products-3

SIOS MeBtechnik GmbH 4 Measuring devices and sensors 6 Length and angle measurement 7 Displacement, angle, straightness measurement and calibration 12 Tactile thickness measurement and calibration 16 Frequency and amplitude stabilized lasers 22 Precision climate measuring station 24

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SIOS products-4

Founded in 1991, SIOS Mefttechnik GmbH, whose roots lie in the Technical University of Ilmenau, is a developer and manufacturer of precision measuring instruments and combines scientific precision and quality with industrial efficiency. Our close proximity to science and research guarantees a high expertise for today and for the upcoming future. The focus of our measuring instruments is on laser interferometric measuring systems. Our products provide reliable and highly accurate results for a variety of measurement tasks in science and research, quality control, product development and calibration....

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SIOS products-5

INDUSTRIAL PERFORMANCE • quality control • volumetric compensation for machines • customized solution SCIENTIFIC COMPETENCE • fundamental research • traceable applications • metrological assemblies • vacuum and cleanroom applications • dynamic data acquisition • customized solutions

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SIOS products-6

Measuring devices and sensors Length measurement Universal length measuring systems of the highest accuracy for measurements and calibrations of guides, measuring workstations and positioning tables, measuring machines and machine tools and for multiple coordinated measurements. The measuring systems are easy to handle, have integrated alignment aids and are able to work with just a reflective surface as a reflector. Laser interferometer model SP 5000 NG • single measuring beam • accommodates tilting angle of reflector up to ± 12.5° • suitable for combined x-y positioning measurements using multiple...

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SIOS products-7

High-precision laser interferometers with three perfectly parallel aligned and independently working measuring beams for simultaneous measurements of length and angles. Either a mirror or the original SIOS reflector unit be used as a reflector. An alignment aid can be integrated in the sensor to align the beam directions to the direction of target movement. • simultaneous length measurements as well as pitch and yaw angle acquisition with the highest accuracy • for measuring arrangements free of Abbe error • OEM and vacuum versions of the device are available (10 m on request) with reflector...

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SIOS products-8

Highly stable laser interferometer with two parallel measuring beams for a wide variety of applications in the field of science and for industrial use. Differential measurement principle allows for remarkable stability during long-term measurements and enhanced compensation of environmental changes. Differential laser interferometer model SP 5000 DI ultra-stable, high-resolution, long-therm measurement beam distance 21 mm (other beam distances on request) extremely low temperature sensitivity < 20 nm / K at least 5 m with plane mirror

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SIOS products-9

special design for feedback applications beam distance 14 mm (other beam distances upon request) extremely low temperature sensitivity <20 nm/K at least 5 m with plane mirror with reflector

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SIOS products-10

Measuring devices and sensors Differential measurement of lengths and an angle The SP 5000 DI/DS interferometer combines the advantages of a differential interferometer with those of a multi-beam interferometer. It combines a highly stable length measurement based on the differential principle with a high-resolution interferometric (pitch) angle measurement. This makes it possible to detect not only the tiniest movements, but also the smallest tilts over larger areas without the results being subject to thermal and physical environmental influences. Displacement angle differential interferometer...

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The SP 5000 DI/TR laser interferometer is a triple-beam differential interferometer, which can measure length as well as both angles with high stability over long periods of time. Triple-beam differential interferometers model SP 5000 DI/TR • highly stable differential length and pitch angle measurements • beam distances 12 mm (angle measurement) • extremely low temperature sensitivity <20 nm/K • OEM and vacuum versions of the device are available (10 m on request) with reflector

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SIOS products-12

High precision laser calibration system with multiple beams for measuring length, pitch angle, yaw angle, roll angle and straightness, for calibration and alignment of axes. Highly demanded in the machine tool field and CMM calibration, up to volumetric calibra tion. We recommend the use of wireless temperature sensors or the climate measuring station to achieves the best results • interferometric measurement for up to 6 DoF simultaneously • Roll angle sensors optionally available • many available accessories for attachment of sensor head and optical components • calibration software according...

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SIOS products-13

Non-contact vibration measurements with focused measurement beam able to detect vibration on almost every surface, rough surfaces included. Determination of vibration spectra,vibration modes, and resonant frequencies of macro and micro objects. • working distance fixed at (customer specific) 30 ... 70 mm / 240 mm / 480 mm • diameter of laser spot 12 ... 30 pm / 100 pm / 200 pm • protected interior optics

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SIOS products-14

Variable measuring distance for easy and fast beam focusing on measurement object surfaces. In combination with a tripod, it's an ideal vibration measuring instrument for usage at different locations. Laser interferometric vibrometer model LSV 2500 NG • working distance continuously adjustable: 240 mm to 2500 mm • digital and analog data output

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SIOS products-15

Non-contact measurements of the dynamic characteristics of microstructures, MEMS and objects in the micrometer size range. Determination of the vibration modes by surface scanning, calibration of AFM cantilevers . Nano Vibration Analyzer NA • scan field range: 50 mm x 50 mm (other ranges upon request) • microscope magnification: 10 x, 50 x (100 x optionally) • laser spot diameter: < 10pm, < 2 pm (Lens dependent) • customized design of the portal upon request

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All SIOS Meßtechnik GmbH catalogs and technical brochures

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.