Si8600/Si8602/Si8605/Si8606 Bidirectional I2C Isolators with Unidirectional Digital Channels
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Si860x B IDIRECTIONAL I 2 C I SOLA TORS WITH U NIDIRECTIONAL D IGITA L C HANNELS Features Independent, bidirectional SDA and SCL isolation channels Open drain outputs with 35 mA sink current High electromagnetic immunity Wide operating supply voltage 3.0 Wide temperature range –40 to +125 °C I2C clocks up to 1.7 MHz Transient immunity 50 kV/µs Unidirectional isolation channels support additional system signals AEC-Q100 qualification (Si8605, Si8606) RoHS-compliant packages Up to 5000 VRMS isolation SOIC-8 narrow body SOIC-16 wide body UL, CSA, VDE, CQC recognition SOIC-16 narrow body 60-year life at rated working voltage Supports Applications Isolated I2C, PMBus, SMBus Power over Ethernet Motor Control Systems Hot-swap applications Intelligent Power systems Isolated SMPS systems with PMBus Description The Si860x series of isolators are single-package galvanic isolation solutions for I2C and SMBus serial port applications. These products are based on Silicon Labs proprietary RF isolation technology and offer shorter propagation delays, lower power consumption, smaller installed size, and more stable operation with temperature and age versus opto couplers or other digital isolators. All devices in this family include hot-swap, bidirectional SDA and/or SCL isolation channels with open-drain, 35 mA sink capability that operate to a maximum frequency of 1.7 MHz. The 8-pin version (Si8600) supports bidirectional SDA and SCL isolation; the Si8602 supports bidirectional SDA and unidirectional SCL isolation, and the 16-pin versions (Si8605, Si8606) feature two unidirectional isolation channels to support additional system signals, such as interrupts or resets. All versions contain protection circuits to guard against data errors when an unpowered device is inserted into a powered system. Small size, low installed cost, low power consumption, and short propagation delays make the Si860x family the optimum solution for isolating I2C and SMBus serial ports. Ordering Information: See page 27. Safety Regulatory Approval UL 1577 recognized Up to 5000 VRMS for 1 minute CSA component notice 5A approval CQC certification approval IEC 60950-1, 61010-1, 60601-1 (reinforced insulation) GB4943.1 VDE certification conformity IEC 60747-5-2 (VDE0884 Part 2) EN60950-1 (reinforced insulation) Copyright © 2013 by Silicon Laboratories

Si860x TABLE O F C ONTENTS Section 1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 1.1. Test Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.1. Theory of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 3. Typical Application Overview . . . . ....

Si860x 1. Electrical Specifications Table 1. Recommended Operating Conditions Symbol Ambient Operating Temperature* Supply Voltage *Note: The maximum ambient temperature is dependent on data frequency, output loading, number of operating channels, and supply voltage. Table 2. Si860x Power Characteristics* 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C (See Figures 2 and 10 for test diagrams.) Test Condition AVDD Current BVDD Current Idda Iddb AVDD Current BVDD Current Idda Iddb AVDD Current BVDD Current Idda Iddb AVDD Current BVDD Current Idda Iddb AVDD Current BVDD...

Si860x Table 2. Si860x Power Characteristics* (Continued) 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C (See Figures 2 and 10 for test diagrams.) Test Condition AVDD Current BVDD Current Idda Iddb AVDD Current BVDD Current Idda Iddb AVDD Current BVDD Current Idda Iddb *Note: All voltages are relative to respective ground. Table 3. Si8600/02/05/06 Electrical Characteristics for Bidirectional I2C Channels1 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C unless otherwise noted. Logic Levels Side B Logic Low Input Voltage Logic High Input Voltage Logic Low...

Si860x Table 3. Si8600/02/05/06 Electrical Characteristics for Bidirectional I2C Channels1 (Continued) 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C unless otherwise noted. Test Condition Timing Specifications (Measured at 1.40 V Unless Otherwise Specified) Maximum I2C Bus Frequency Propagation Delay 5 V Operation Side A to Side B Rising4 Side A to Side B Falling4 Side B to Side A Rising Side B to Side A Falling 3.3 V Operation Side A to Side B Rising4 Side A to Side B Falling4 Side B to Side A Rising Side B to Side A Falling Pulse Width Distortion 5V Side A Low to Side B...

Si860x Table 4. Electrical Characteristics for Unidirectional Non-I2C Digital Channels (Si8602/05/06) 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C Test Condition Positive-Going Input Threshold Negative-Going Input Threshold Input Hysteresis High Level Input Voltage Low Level Input Voltage High Level Output Voltage Low Level Output Voltage Maximum Data Rate Minimum Pulse Width Input Leakage Current 1 Output Impedance Timing Characteristics Propagation Delay Pulse Width Distortion |tPLH – tPHL| Propagation Delay Skew2 Channel-Channel Skew tPHL, tPLH Output Rise Time Output...

Si860x Table 5. Electrical Characteristics for All I2C and Non-I2C Channels 3.0 V < VDD < 5.5 V. TA = –40 to +125 °C. Typical specs at 25 °C Test Condition Common Mode Transient Immunity Shut Down Time from UVLO Start-up Time *Note: Start-up time is the time period from the application of power to valid data at the output. Figure 1. Propagation Delay Timing (Non-I2C Channels)

Si860x 1.1. Test Circuits Figure 2 depicts the timing test diagram; Figure 3 depicts the CMTI test diagram. Figure 2. Simplified Timing Test Diagram Input Signal Switch 3 to 5 V Isolated Supply Isolated Ground Input High Voltage Differential Probe Vcm Surge Output High Voltage Surge Generator Figure 3. Common Mode Transient Immunity Test Circuit