UV-VIS-NIR Spectrophotometer

Incorporating the latest technology to achieve high sensitivity, high resolution, and an ultra-low stray light level, leading the way to new solutions UV-VIS-NIR Spectrophotometer

High Sensitivity Shimadzu developed the world’s first UV-VIS-NIR spectrophotometer with three detectors, consisting of a PMT (photomultiplier tube) for the ultraviolet and visible regions and InGaAs and cooled PbS detectors for the near-infrared region. With conventional instruments that use only PMT and PbS detectors, there is a drop in sensitivity in the crossover region between those detectors. Using an InGaAs detector to cover this crossover region, however, ensures high sensitivity across the entire measured wavelength range, and gives a noise level of 0.00003 Abs at 1500 nm. In addition...

Hig h S en s itiv i t y The UV-3600 Plus provides precise transmittance or reflectance measurements in the ultraviolet to near-infrared regions. The level of sensitivity in the near-infrared region is significantly enhanced by using the combination of an InGaAs detector and a cooled PbS detector for this region. Spectra can be obtained without interruption for the entire range, with a high level of sensitivity and precision. InGaAs detector PMT Optical system around detectors Sensitivity Characteristic 100 Relative Value (%) Some spectrophotometers use a PMT (photomultiplier tube) for the ultraviolet...

Comparison between Two-Detector and Three-Detector Measurements With the UV-3600 Plus, an InGaAs detector is used in addition to a PMT (photomultiplier tube) and a cooled PbS detector. This serves to significantly reduce the noise level in the InGaAs detector range (900 to 1,600 nm), in comparison to a conventional two-detector instrument (i.e., equipped with only PMT and a PbS detectors). UV-3600 Plus(InGaAs detector) PbS detector The figure on the right shows transmittance spectra for water measured with the UV-3600 Plus (InGaAs detector and cooled PbS detector) and a conventional instrument...

High Resolution, Low Stray-Light Level, and Wide Wavelength Range The UV-3600 Plus is equipped with a high-performance, grating-grating double monochromator, and achieves a low stray-light level with high resolution. The wavelength range is 185 to 3,300 nm. This instrument can perform spectrophotometry for various types of samples, ranging from those requiring high resolution, such as gas samples, to highly concentrated liquid samples. High-Resolution Spectra of Benzene Gas The spectrum shown on the left was obtained by enclosing benzene gas in a cell with an optical-path length of 10 mm and...

Covers Wide Wavelength Range from Ultraviolet to Near-Infrared The wavelength range of 185 to 3,300 nm enables measurement over the ultraviolet, visible, and near-infrared regions. In addition, the acquired spectra exhibit little noise across the entire range. The figure on the right shows a spectrum obtained by measuring toluene in the range of 185 to 3,300 nm using a cell with an optical-path length of 2 mm. Spectra in the ultraviolet, visible, and near-infrared regions can be obtained. 80.000 The figure on the right shows the spectrum for a low-transmittance film on a silica wafer in the range...

A Wealth of Applications Electrical, Electronics, and Optics High-absorbance measurement of polarizing films Reflection measurement of multilayer films Absolute reflectance measurement of highly reflective mirrors Spectral characteristic measurement of beam splitters Relative emission measurement of LEDs Transmittance measurement of quartz plates Absolute reflectance measurement of anti-reflection coatings Transmittance measurement of functional films Diffuse reflectance measurement and band gap measurement of semiconductor materials Transmittance measurement of solar cell cover glass, etc. Food...

E le ct ric al, Elec tronic s, and Optic s Transmittance Measurement of Very Small Samples The current miniaturization of various products, such as sensors, means that the measurement of very small samples is now required. The figure shows the results of a transmission spectrum measurement on a micro-sensor window. When small samples are measured, the size of the light beam must be adjusted to the size of the sample. By using an optional MPC-603 unit and an aperture unit (P/N 206-27362-91), the measurement beam can be narrowed to 2 mm in diameter, which allowsan appropriate optical system toube...

A Wealth of Applications E le ct ric al, Elec tronic s, and Optic s Absolute Reflectance Measurement of Mirrors The reflectance of mirrors used in telescopes, lasers, and some other devices is extremely important because it serves as a factor in determining their performance. The total light reflecting off of a sample can be composed of a specular component and a diffuse component. For mirrors, the specular reflectance is the reflectance component of significance. In addition, reflectance measurements can be made as relative to the reflectance of a background material or as absolute. Absolute...

Ele ct ric al, Elec tronic s, and Optic s Band Gap Calculation Research into solar-cell and photocatalytic materials often involves the measurement of the band gap, which is a basic physical property of the materials. Shown below are the diffuse reflectance spectra of three semiconductor materials used in the production of solar cells using the ISR-603 integrating sphere. The absorption edge, the wavelength where the reflectance decreases, differs depending upon the sample type. This difference indicates a difference in the band gap* of the samples. The band gaps of the samples were calculated...

A Wealth of Applications C h emic als Thickness Measurement of Plastic Wrap for Food Packaging Interference wave patterns sometimes occur when light passes through a thin, transparent film. The film thickness of a sample can be determined from the wavelength intervals of these interference wave patterns. The figure shows the transmittance spectrum of plastic wrap for food packaging. An interference wave pattern can be seen. By utilizing the optional film thickness measurement software, the film thickness was calculated to be 10.4 μm. Note: The refractive index of the sample must be entered in...