Wide-Range High-Speed Detector for XRD-6100/7000

Shimadzu X-ray Diffractometers for XRD-6100/7000 OneSight Wide-Range High-Speed Detector TM Wide-Range High-Speed Detector Achieves High-Speed, High-Sensitivity Performance The OneSight is a wide-range high-speed detector consisting of a number of semiconductor devices. It is able to achieve intensity more than 100 times higher than a scintillation detector. The OneSight can also perform wide-angle range measurement without a scanning goniometer for significantly higher throughput. It can be easily mounted on existing XRD-6100/7000 units installed at customers’ sites*. *It is necessary to set...

High-Speed Quantitative Analysis Using Three Types of Measurement Modes The OneSight features three types of measurement modes: High Resolution, Standard, and Fast. It enables measurements speeds 10 times faster (High resolution), 15 times faster (Standard), and 25 times faster (Fast) than those attained with a scintillation detector. Scintillation Detector High Resolution Mode About 1/10 Standard Mode About 1/15 Fast Mode About 1/25 θ-2θ(deg) Sample : Silicon Measurement Time ONE SHOT Mode Achieves Simultaneous Measurement of Diffraction Profile at a Wide Range Angle The OneSight can perform...

The measurement software for the OneSight adopts a new design. The analytical profile and schedule display are located in the center, the analytical conditions list and machine status display are indicated on the left, and the detailed analysis conditions display is shown on the right. This new design makes it easy for a user to understand the measurement status at a glance. It is also possible to change the arrangement. Perform loading, editing, and creating of analytical conditions. Displays the analysis profile, which can be enlarged or reduced as preferred. Detailed analysis condition display...