Multitype ICP Emission Spectrometer

ICP-AES Multitype ICP Emission Spectrometer Higher accuracy analysis and easier operation exemplify the thought we’ve put into the basics of our analytical devices Used in a broad range of fields, ICP emission spectrometers feature ppb-level detection ability and 5-6 orders of linear dynamic range, which permits a wide concentration of samples to be measured. In addition, they enable batch analysis of multiple elements. Recent wider usage has resulted in an increased demand for shorter analysis times and improved high-matrix sample detection. As a result, we have developed two models a "multitype"...

Multi-fanctional assistant software simplifies plasma emission spectroscopy Non-interfering wavelengths are automatically distinguished from multiple wavelengths for each measurement sample Multifaceted diagnosis of coexistent element interference quantities Methods are automatically corrected, based on determining the necessity of each type of correction Simple and Accurate Simply and accurately measure all types of samples

Ultra-Trace Element Detection and Component Analysis for Highly Precise Analytical Results ICP Emission Spectrometry Inductively coupled plasma emission spectrometers generate a high-temperature plasma by ionizing argon using a high frequency (27.12 MHz). Liquid samples are aspirated and atomized by a nebulizer and then supplied to the plasma to excite the elements in the sample, thus causing them to emit light. Axial observation 1. Measures a variety of elements with high sensitivity and saves energy by analyzing multiple elements simultaneously. Cooling water A 5-6 order of linear dynamic range...

ICPEsolution Software Makes ICP Analysis Easy A Wealth of Analytical Technology Makes ICP Emission Spectrometry Easy

Simple to Operate Using Five Icons ICPEsolution software is very easy to operate, allowing even inexperienced operators to start measurements in only five steps after startup. Because measurements are recorded continuously for all elements and all wavelengths, data can be recalled for each element or wavelength without re-measuring. Measurement results can be evaluated automatically as well. Process Flow of Analysis Using ICPEsolution (analytical procedure settable from one main window) , "\ F:ie Edit V:e;.v Analysis Instrument Method Window Help Automatical!}' Shut off Plasma Recall Three analytical...

Continuously Records All Elements and All Wavelengths 1. Measurements can be recorded for all elements and all The state-of-the-art CCD used in the ICPE-9000 continuously records measurements for all elements and wavelengths. 2. Wavelengths can be added after measuring. Since measurements are recorded for all wavelengths, it is easy to consider additional wavelengths even after measuring. Therefore, it is not necessary to determine optimal wavelengths before measuring. 3. Elements can be added after measuring. Once a standard sample containing a mixture of elements has been measured, even if...

Automatically Evaluates Measurement Data Method Diagnosis Assistant In ICP emission spectrometry, measurement errors can have a number of causes, including physical interference, ionization interference, and spectral interference. For this reason, it is sometimes necessary to determine whether or not values in the measurement results are truly correct. The ICPE-9000's Method Diagnosis Assistant evaluates the causes of errors for each measurement sample. It then allows modifying methods easily by displaying a way to resolve the causes of errors based on the diagnosis results so that the method...

Automatic Wavelength Selection In ICP emission spectrometry, the optimal wavelength can differ for different determining the optimal wavelength. With ICPEsolution, only the optimal samples, due to the effects of spectral interference from coexisting elements. measurement results are shown, regardless of the number of wavelengths As a result, determining the optimal wavelength is required. registered. ICPEsolution continuously monitors all elements included in the ICPEsolution simplifies this process by including a function for automatically measurement sample and automatically evaluates the amount...

Switchable Between Axial and Radial Observation Directions Axial / Radial Directions The ICP instrument allows observation from two directions, either axial or radial. Axial Observation • High sensitivity (ppb level) Radial Observation • Enables measuring high-concentration samples. • Minimizes ionic interference from matrix. Axial Observation System An orifice for capturing light is located above the torch. This area is cooled jacket to prevent the optics from being contaminated by particulates from using a cooling jacket to minimize thermal effects from the plasma. In addition, purge gas flows...

High Sensitivity and High Resolution Equipped with Schmidt Mirror (aberration correcting mirror) Spectrometers without an astigmatism correction function cause the The ICPE-9000 optical sysytem includes a Schmidt mirror for photoelectric surface of the detector to be blurry along its perimeter, correcting astigmatism. Consequently, it allows obtaining data with which results in poor resolution and sensitivity. high sensitivity and high resolution. With Schmidt Mirror (ICPE-9000) Without Schmidt Mirror Telemeter Schmidt mirror Echelle diffraction grating Entrance slit Plasma light source Low noise,...

Vertical Torch Orientation Contamination-Free ICP emission spectrometers that only offer high-sensitivity axial observation To resolve such problems, the ICPE-9000 uses a vertical torch orientation are not ideal for high-matrix samples. This unsuitability is mainly due to that has proven successful for high-matrix samples. As a result, analytical sample adhesion to the torch caused by torch orientation. element memory effects and torch blockage are minimized, even for With a horizontal torch layout, the sample gradually falls due to gravity high-matrix samples, ensuring stable measurement. while...