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Circuit Protection Applications Test Lab

Circuit Protection Applications Test Lab

Circuit Protection Applications Test Lab

Product catalog summary
Overview: ON Semiconductor provides a comprehensive testing laboratory for circuit protection components and applications. The lab offers technical assistance to ensure compliance with international regulatory specifications and helps solve critical design issues.
Testing Capabilities: The lab is equipped to perform Electrostatic Discharge (ESD) and Surge testing, crucial for assessing the susceptibility of electronic components to damage from ESD events and surge voltages. Key equipment includes the Noiseken ESS2000 ESD Tester and the Keytek ECAT Surge Generator.
ESD Testing: The lab can conduct tests according to standards such as IEC 61000-4-2, JEDEC EIA/JES22, and others, using models like the Human Body Model (HBM), Machine Model (MM), and Charge Device Model (CDM).
Surge Testing: Surge tests are performed to ensure electronic products can withstand realistic surge voltages, complying with standards like IEC 61000-4-4, IEC 61000-4-5, and others.
Additional Capabilities: The lab can perform various environmental tests, including Burn-in, Biased Humidity, Temperature Cycle, Thermal Shock, and HAST, to provide insights into application problems.
Contact Information: The document provides extensive contact details for technical support and sales assistance across various regions, including North America, Europe, and Asia.
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Catalog excerpts

Circuit Protection Applications Test Lab-2

ON Semiconductor, a leader in circuit protection products, offers a complete component and applications testing laboratory. At our facility, we can offer you technical assistance with circuit protection design to comply with international regulatory specifications. Our expertise and equipment are available for customer projects and to help solve critical design issues. With our extensive knowledge and expertise, we are able to characterize the performance of protection components and system applications under both normal operational and harsh environmental conditions. Our objective is to provide...

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Circuit Protection Applications Test Lab-3

Surges occur on the Telecom datalines or AC power mains as a result of switching operations in the power grid and from nearby lightning strikes, either directly to the power distribution system or to nearby ground. Radiated coupling of surges into I/O lines generally occurs only when the lines are very long. Electronic products are tested for Surge immunity to insure their continued reliable operation if subjected to realistic levels of surge voltages. In the ON Semiconductor Applications Test Lab we are able to perform many of the surge tests needed to comply with the industry standards such...

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