Overview

This document presents Seiken's offerings in precision testing solutions, focusing on contact probes and vertical probe cards designed for semiconductor and electronic component testing.

Product Categories

• Contact Probes and Vertical Probe Cards: Specialized for precision testing with customizable options to meet various probing requirements.
• Test Fixtures and IC Sockets: Designed for high-frequency and high-current applications, including non-magnetic variants.

Key Features and Specifications

• High-frequency capability suitable for advanced electronic testing.
• Non-magnetic materials available to prevent interference during testing.
• High-current handling capacity for robust testing scenarios.
• Fully customizable designs allowing direct PCB attachment and easy maintenance.

Benefits and Recommendations

• Solutions tailored to diverse probing needs ensuring flexibility and precision.
• Ease of maintenance reduces downtime and operational costs.
• Customization supports integration into various testing environments.

Additional Information

For more details and inquiries, visit Seiken's official website at https://www.seiken.co.jp/english/.