XPS-Lab
2Pages

Catalog excerpts

The new XPS-Lab has been designed to combine outstanding quantitative XPS performance and ease of operation with a modular sample handling concept. The exceptional value of the XPS-Lab is based on the high-transmission, high-speed Argus CU hemispherical analyser. The versatile XPS-Lab incorporates advanced system, instrument and software technology based on Scienta Omicron's comprehensive electron spectroscopy and surface analysis experience. The XPS-Lab has been designed to combine outstanding quantitative XPS performance and ease of operation with a modular sample handling concept. The XPS-Lab is configured with the high transmission Argus CU hemispherical analyser and high power monochromated Al Ka X-ray source, specifically combined to offer the highest sensitivity for quantitative XPS analysis. To complement and extend the standard XPS functionality, a broad range of dedicated options is available to ensure that the XPS-Lab can provide the experimental solutions your laboratory needs, no matter how diverse. a standalone tool with an independent sample load lock, which allows the introduction of three sample plates during one loading/unloading cycle. The alternative concept is based on the Large Sample Carrier with 30 cm2 loading area for differently shaped specimens. This exceptionally versatile specimen handling system allows not only the automated sequential measurement of multiple samples and positions, but also enables the application of specialized sample holders, like the powder sample holder and the atmosphere container for air-sensitive specimens. The integrated calibration block simplifies periodic routine measurements to ensure the reliability of the acquired data. Advanced in-situ photoelectron experiments are enabled by virtually live snapshot data acquisition and extended sample manipulation possibilities, e.g. a wide temperature range (130 < T < 1100 K). The XPS-Lab at a glance: ■ Outstanding quantitative XPS performance The XPS-Lab offers two sample handling concepts: The standard configuration is designed for small sample plates. It can either be directly integrated to Scienta Omicron's broad range of surface science instruments or serve as ■ Compact footprint with excellent accessibility ■ User friendly experiment control and data acquisition software ■ Versatilely configurable to meet individual demand ■ Subsystem for Materials Innovation Platform MIP

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XPS-Lab components & options Argus CU analyser XM 1000 monochromated X-ray source Gas cluster ion beam source (GCIB-10S) Focused Ar+ Ion Gun Charge Neutralizer Load lock VUV light source DSX 400 dual anode source X-ray source Technical Data System Details Base pressure: Chamber materials: Sample handling options: Features - 128 channel detection - Large area XPS - Selected area XPS - Angle resolved XPS - Snapshot XPS - Monochromated Al Kα** - Charge neutralization** - Imaging XPS** - Sputter depth profiling** - Gas cluster ion beam sputtering** - VUV light source for UPS** - Electron source...

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