VT SPM
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VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology r • 25 K - 1500 K • True pA STM • Improved dl/dV Spectroscopy • Beam Deflection AFM • QPlus AFM • In-situ Evaporation V___ scientaomicron www.scienaaomicron.com

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology VT Series: Major Product Releases: 1994 VT STM 1998 VT with Beam Deflection AFM 2003 sub -pA STM & improved spectroscopy 2008 VT with QPlus AFM STM & AFM in UHV at Variable Temperatures After a period of rapid development, Scanning Probe Microscopy (SPM) has become a standard analysis technique in surface science. The Scienta Omicron VT SPM is the established microscope in many research labs. It won the prominent R&D 100 award in 1996 and to the present day more than 500 instruments have been delivered and...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology In-Situ Growth Heating and Cooling Concept for Temperatures from 25 K to 1500 K The VT STM incorporates a unique 3D tip positioning design ensuring completely independent movement in X, Y, and Z. The 3D positioning unit consequently allows precise tip coarse positioning in the sub-micrometer range. The guided positioning within a range of X/Y/Z = (10 x 10 x 10) mm allows tip coarse re-approach with an ultra-small lateral shift (typically < 50 nm) for several hundred coarse steps. Before Evaporation Cooling...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology True pA STM and Tunneling Spectroscopy Capacitive Compensation via Preamplifier Technology All instruments of the VT series are equipped with state-ofthe-art STM and STM spectroscopy capabilities. It is possible to extend this with AFM functionality, and the VT instruments can be used either with Beam Deflection AFM, the ‘QPlus‘ AFM, or with both types of AFM. Optimized for Modulation Spectroscopy Internal switch (Software controlled) R1 Sensor-sample intrinsic capacitance Capacitive compensation Bias current...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology The classical Beam Deflection AFM method uses a microscale cantilever with a sharp tip at its end. The cantilever is typically silicon or silicon nitride with a tip radius curvature on the order of several nanometers. The ‘QPlus‘ sensor is a new approach for non-contact-AFM. It is ideally suited for high resolution AFM with small oscillation amplitudes. The QPlus sensor uses a modified quartz tuning fork. One prong of the tuning fork is fixed while the SPM probe tip is mounted to the (free oscillating) second...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology AFM Modes and Forces Lock-in amplifier Scanning Kelvin Probe Microscopy (SKPM): In SKPM an AC and a DC voltage are applied between tip and sample. The lock-in technique provides information on work function changes on a surface and correlates it with the simultaneously recorded topography information. Detection at frequency 2f2 can be used for Scanning Capacitance Microscopy (SCM). Electrostatic Force Microscopy (EFM): By applying a voltage between tip and sample, EFM can be used to study capacitance, surface...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology Oscillation amplitude Contact Mode Short-range force (Morse potential) Forces in Atomic Force Microscopy AFM Long-range (νdW) force Total force Multi-mode operation Contact mode Tunneling current Deflection detection Plot of tunnelling current and typical force potentials as a function of distance between surface and front sensor atom. For AFM, interaction involves many more tip atoms than for STM. Shaded area: small QPlus oscillation amplitudes in combination with specific df setpoints allow for tuning the...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology Handling & Navigation Transfer rod Analysis chamber SPM Sample plate in transfer rod. Optical Access Manipulator The VT STM can optionally be equipped with a long focal length optical microscope for sensor navigation (shown above on a Scienta Omicron system). A dedicated set-up with a high-resolution CCD camera provides optical resolution below 10 µm. Wobble stick Sample plate in rotated manipulator - ready for pick up with wobble stick. Bolt-on chamber Easy Sample Transfer An easy-to-use, pincer-grip wobble...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology Integration & Bolt-on Concept Easy UHV System Integration The VT instruments are housed in their own, dedicated UHV chambers which can either be mounted onto a standard Scienta Omicron system (MULTIPROBE™…) or bolted-on to an existing vacuum system. In this case the wobble stick enables the sample transfer from the main vacuum system to the VT instrument. SPM Probe (left) and two customized subsystems with VT SPM. The VT bolt-on instrument concept allows easy access to the microscope (optical access, in-situ...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology Impressive Results at Various Temperatures 0K Growth of ice. Temperature: 140 K Literature: [4] [1] G. Urbanik et al. ‘Surface of underdoped YBa2Cu3O7−δ as revealed by STM/STS‘, Eur. Phys. J. B 69, 483–489 (2009) [2] R. Fasel, M. Parschau, K.-H. Ernst, Angew. Chem. Int. Ed. 42 , 5178 (2003); Angew. Chem. 115, 5336 (2003); Nature 426, 615 (2003) [3] V. P. LaBella et al., SCIENCE 25, Vol 292 (2001). [4] K. Thürmer and N. C. Bartelt, PHYSICAL REVIEW B 77, 195425 (2008), Physical Review Letters 100,186101 (2008)...

VT Series - Variable Temperature UHV SPM Benchmarking UHV STM and AFM Technology Linköpping Roma Taunusstein Uppsala Bucharest Moscow Ankara St. Cannat Madrid Mc Murray Davidson Eden Prairie Denver Los Angeles Shanghai Beijing Tokyo Taiwan Mumbai Singapore We have agents and sales representatives around the world - and right next door. Please check our website for your local contact and partner. Many thanks. www.scientaomicron.com Germany Limburger Str. 75 65232 Taunusstein GERMANY +49 6128 987 – 0 info@scientaomicron.com Technical Data Scan (and offset) range X/Y/Z: Variable temp....