TESLA JT SPM
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> 5 days uninterrupted measurement time in varying magnetic fields with only 11 L LHe Temperatures down to 1 K with 4He Ultra low thermal drift Magnetic fields Bz > 3 T Optical access STM and QPIusAFM Ergonomic design & expandable to clusters

The Next Breakthrough The TESLA JT SPM is the latest development in Scienta Omicron's long history of successful scanning probe microscopes. It is based on a strategic partnership with CryoVac GmbH, whose field proven, proprietary Joule-Thompson (JT) cooling and UHV magnet technology are united with our expertise in STM, advanced spectroscopy and QPlus AFM. The TESLA JT SPM sets the standard in SPM performance in varying magnetic fields with picometer stability and thermal drift below 20 pm per hour. The system is based on a modern, ergonomic design that delivers dependable high performance...

3-stage locking mechanism: Three positions for sample exchange, ip exchange and SPM measurement. Rigid mechanical and thermal locking of the microscopy during sample and ip exchange. Release of the microscope into the eddy current damping system for SPM operaion. Cryostat & Magnet Technology Cryovac's UHV cryostat technology provides' 5 days uninterrupted SPM measurement time at low temperatures with exceptionally low LHe consumption of only 11 L. Operating and ramping the UHV magnet has virtually no impact on LHe hold time and consumption. To achieve temperatures down to 1 K, the bath...

The TESLA JT SPM Microscope The TESLA JT SPM o i es the uli ate i tri si sta ilit for o i uous high resoluio i agi g a d spe tros op i var i g ag ei elds. Measu e e t odes STM, o - o ta t AFM Plus a d o plete set of spe t os op odes i ludi g STS, ETS, a d fo e spe t os op . The st i t use of o - ag eit ate ials allo s fo e ie t sp i g suspe sio of the SPM head i ag ei ields. A edd u e t da pi g stage is lo ated elo the i os ope, su ie tl fa f o the supe o du i g ag et. The i os ope p o ides opi al a ess th ough fou e a li g po ts fo isi ilit of the ip posiio a d app oa h, i situ deposiio a...

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The TriLeg Design for the TESLA JT SPM The devoio of S ie ta O i ro to pre isio e gi eeri g a d the e perie e of 30 ears i the SPM usi ess is e odied i the TESLA JT SPM. The e T iLeg desig is the plafo fo the TESLA JT SPM, a dedi ated UHV s ste fo high esoluio SPM. A sepa ate p epa aio ha e is a aila le fo sa ple spute i g, thi il e apo aio a d i -situ g o th ha a te izaio . The T iLeg is tailo ed to a ds e go o i ope aio , o e ie e, a d sta ilit fo state-of-the-a t SPM esea h. UHV ath Sa ple p epa aio ha e ith a ipulato fo sa ple heai g a d ooli g, po ts fo spute i g, e apo aio , LEED a d...

Today's research requires the complementary use of various surface analysis methods and thin film deposition techniques. Based on Scienta Omicron's vast expertise in engineering, UHV system solutions are tailored to the specific needs of the customer's . ' < experiment. Due to its modular design, the TESLA JT SPM is expandable for new requirements - even after years. TESLA JT SPM combined with an ARPES-Lab with R3000 ARPES spectrometer. A LTL (Linear Transfer Line) is connecting the two systems. TESLA JT SPM combined with an ARPES-Lab with DA30 ARPES spectrometer and three EVO 50 MBE...

Asia & Australia We have agents and sales representatives around the world - and right next door. Please check our website for your local contact and partner. Many thanks. www.scientaomicron.com Technical Data NbSe2 at 1.01 K - Charge Density Wave, V = 50 mV, lT = 0.6 nA,B = 0 T, 14x14 nm Microscope STM resolution: Atomic, Au(lll) QPlus AFM resolution: Atomic, single crystal NaCl (100) or Si(lll) 1.2 x 1.2 x 0.2 (1.5 K) Electrical ip contacts: 3 (used for QPlus) Sample coarse range: XZ = 4 x 6 mm Electrical sample contacts: 4 (incl. one for GND or U ) Gap voltage: ±1 V and ±10 V Optical...