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TESLA JT SPM

Product catalog summary

Overview of TESLA JT SPM System

The TESLA JT SPM is a state-of-the-art scanning probe microscope (SPM) developed by Scienta Omicron, designed for ultra-high vacuum (UHV) and low temperature applications with high magnetic fields. It integrates Joule-Thomson (JT) cooling technology and superconducting magnets to achieve stable operation at temperatures down to approximately 1 K and magnetic fields exceeding 3 Tesla.

Key Specifications and Features

Temperature and Cooling: Utilizes JT cooling with helium isotopes (He, He3 optional) to reach temperatures near 1 K. The cryostat includes LHe and L2 reservoirs with vapor-cooled shields for thermal insulation.
Magnet System: UHV-compatible superconducting split-pair magnet providing axial magnetic fields up to 3 T or higher, optimized for low heat load and minimal helium consumption.
SPM Head and Mechanics: Features a spring-loaded tip carrier with electrical contacts for combined STM and AFM operation, including advanced spectroscopy modes (STS, ETS, force spectroscopy). The system supports independent sample and tip exchange with a three-position locking mechanism for stability during operation.
Optical Access: Four optical ports positioned at azimuthal angles allow in-situ tip observation, laser illumination, and deposition experiments, enhancing experimental versatility.
Vibration and Noise Control: The rigid UHV system is mounted on damping legs and includes eddy current damping to ensure mechanical stability and minimize noise during measurements.

Performance Highlights

Atomic resolution STM imaging on Au(111) surfaces at 1 K, demonstrating pico-meter scale stability and minimal thermal drift.
Continuous SPM operation during magnetic field ramping from 0 to 3 T, maintaining image stability and resolution.
Superior energy resolution in spectroscopy modes due to low temperature and low noise environment.

System Design and Ergonomics

The TESLA JT SPM is built on the TriLeg UHV platform, offering a small footprint, ergonomic operation, and high mechanical rigidity.
Separate preparation chamber available for sample sputtering, thin film evaporation, and in-situ growth characterization.
Independent sample and tip exchange mechanisms with optical monitoring via CCD camera reduce downtime and improve ease of use.

Modularity and Integration

The system is modular and expandable, allowing integration with other surface science techniques such as ARPES (Angle-Resolved Photoemission Spectroscopy) and molecular beam epitaxy (MBE) systems.
Linear transfer lines and radial telescoping arms enable safe and efficient transfer of samples between modules.

Technical Data Summary

Parameter	Value / Description
STM Resolution	Atomic resolution on Au(111) at 1 K
Sample Coarse Range	6 mm x 6 mm x 6 mm
Sample Size	Up to 10 mm diameter
Tunneling Voltage	±10 V
Tunneling Current	pA to μA range
Minimum Temperature	~1 K (He3 optional)
Magnetic Field	Up to 3 T (typical), higher on request
Optical Access	Four azimuthal ports with R-filtered windows
UHV Base Pressure	Guaranteed <10^-10 mbar

Best Practices and Recommendations

Use non-magnetic materials for sample holders and tips to avoid interference with magnetic fields.
Maintain helium supply and monitor consumption to ensure stable low temperature operation.
Utilize optical ports for in-situ monitoring and laser-based experiments to maximize experimental capabilities.
Follow ergonomic procedures for sample and tip exchange to minimize contamination and mechanical disturbances.

Conclusion

The TESLA JT SPM represents a breakthrough in low temperature, high magnetic field scanning probe microscopy, combining advanced cooling, magnet technology, and mechanical design to deliver exceptional stability, resolution, and versatility for surface science research. Its modular design and integration capabilities make it suitable for a wide range of experiments requiring precise control of temperature, magnetic field, and surface conditions.

Catalog excerpts

> 5 days uninterrupted measurement time in varying magnetic fields with only 11 L LHe Temperatures down to 1 K with 4He Ultra low thermal drift Magnetic fields Bz > 3 T Optical access STM and QPIusAFM Ergonomic design & expandable to clusters

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The Next Breakthrough The TESLA JT SPM is the latest development in Scienta Omicron's long history of successful scanning probe microscopes. It is based on a strategic partnership with CryoVac GmbH, whose field proven, proprietary Joule-Thompson (JT) cooling and UHV magnet technology are united with our expertise in STM, advanced spectroscopy and QPlus AFM. The TESLA JT SPM sets the standard in SPM performance in varying magnetic fields with picometer stability and thermal drift below 20 pm per hour. The system is based on a modern, ergonomic design that delivers dependable high performance SPM...

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3-stage locking mechanism: Three positions for sample exchange, ip exchange and SPM measurement. Rigid mechanical and thermal locking of the microscopy during sample and ip exchange. Release of the microscope into the eddy current damping system for SPM operaion. Cryostat & Magnet Technology Cryovac's UHV cryostat technology provides' 5 days uninterrupted SPM measurement time at low temperatures with exceptionally low LHe consumption of only 11 L. Operating and ramping the UHV magnet has virtually no impact on LHe hold time and consumption. To achieve temperatures down to 1 K, the bath cryostat...

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The TESLA JT SPM Microscope The TESLA JT SPM o i es the uli ate i tri si sta ilit for o i uous high resoluio i agi g a d spe tros op i var i g ag ei elds. Measu e e t odes STM, o - o ta t AFM Plus a d o plete set of spe t os op odes i ludi g STS, ETS, a d fo e spe t os op . The st i t use of o - ag eit ate ials allo s fo e ie t sp i g suspe sio of the SPM head i ag ei ields. A edd u e t da pi g stage is lo ated elo the i os ope, su ie tl fa f o the supe o du i g ag et. The i os ope p o ides opi al a ess th ough fou e a li g po ts fo isi ilit of the ip posiio a d app oa h, i situ deposiio a d...

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TESLA JT SPM E elle t STM Perfor a e B=1.9 T ﬁt ﬁt overview detail detail Supe o du i g gap ith ip at T . ap idth . eV a . to CS a d o i aio of i os ope te pe atu e. o i st u e tal e e g oade i g e ept U od HF ilte s used . Life i e oade i g of D es it V Red Data, la k it . Ato i esoluio STM o Au at T sho i g o ugaio i the pi o ete a ge a d he i g o e e o st u io . se ts Li e p oiles. Top . T, S a a ge. oto T, S a a ge. Displacement sqrt (x2 + y2) Start E epio all lo the al d i at T . 6 hou s total a usiio i e sho i g a the

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The TriLeg Design for the TESLA JT SPM The devoio of S ie ta O i ro to pre isio e gi eeri g a d the e perie e of 30 ears i the SPM usi ess is e odied i the TESLA JT SPM. The e T iLeg desig is the plafo fo the TESLA JT SPM, a dedi ated UHV s ste fo high esoluio SPM. A sepa ate p epa aio ha e is a aila le fo sa ple spute i g, thi il e apo aio a d i -situ g o th ha a te izaio . The T iLeg is tailo ed to a ds e go o i ope aio , o e ie e, a d sta ilit fo state-of-the-a t SPM esea h. UHV ath Sa ple p epa aio ha e ith a ipulato fo sa ple heai g a d ooli g, po ts fo spute i g, e apo aio , LEED a d othe...

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Today's research requires the complementary use of various surface analysis methods and thin film deposition techniques. Based on Scienta Omicron's vast expertise in engineering, UHV system solutions are tailored to the specific needs of the customer's . ' < experiment. Due to its modular design, the TESLA JT SPM is expandable for new requirements - even after years. TESLA JT SPM combined with an ARPES-Lab with R3000 ARPES spectrometer. A LTL (Linear Transfer Line) is connecting the two systems. TESLA JT SPM combined with an ARPES-Lab with DA30 ARPES spectrometer and three EVO 50 MBE Systems....

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Asia & Australia We have agents and sales representatives around the world - and right next door. Please check our website for your local contact and partner. Many thanks. www.scientaomicron.com Technical Data NbSe2 at 1.01 K - Charge Density Wave, V = 50 mV, lT = 0.6 nA,B = 0 T, 14x14 nm Microscope STM resolution: Atomic, Au(lll) QPlus AFM resolution: Atomic, single crystal NaCl (100) or Si(lll) 1.2 x 1.2 x 0.2 (1.5 K) Electrical ip contacts: 3 (used for QPlus) Sample coarse range: XZ = 4 x 6 mm Electrical sample contacts: 4 (incl. one for GND or U ) Gap voltage: ±1 V and ±10 V Optical Access...

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