SPHERA
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XPS without Compromise SPHERA • Advanced lens design for small area XPS and SAM • High count rates for rapid quantification • Excellent sensitivity for XPS, ISS, AES and UPS • Integrated lens deflectors for imaging XPS • CASCADE automation system • Rapid upgrade of outdated XPS systems SPHERA 401-V03/Sept.08

Omicron NanoTechnology GmbH www.omicron.de 2 The Ultimate Tool for Schematic diagram of the SPHERA analyser showing the aperture selection tumbler. Lens aperture selection drive Imaging XPS overview of the whole sample (Quartz microbalance) Field of view (F.O.V): 15 x 15 mm / Resolution: No specification / Acquisition: 20 mins, Au map. Rapid imaging XPS map for Selectable Area XPS (SA-XPS) of points of interest 1-3 F.O.V: 5 x 5 mm / Resolution: < 100 ìm / Acquisition: 14 mins, Au map. Point 1 Point 2 Point 3 1 mm Widescan spectrum of contaminant region at point 1: Primary constituents: Ag +...

Omicron NanoTechnology GmbH www.omicron.de SPHERA and iSPHERA The latest generation of the range of SPHERA hemispherical analysers continues to help answer challenging surface analytical questions with novel, reliable features, regardless of system configuration. Whether an integral part of an Omicron ESCA solution, multi-function platform with SPM or thin film growth, or as an upgrade of an out of date XPS platform, the SPHERA-CASCADE package delivers uncompromising XPS performance in-line with the expectations of modern research. Both SPHERA and iSPHERA incorporate features which enhance...

Omicron NanoTechnology GmbH www.omicron.de 4 Lens Geometry The SPHERA transfer lens has been designed so that XPS performance is uncompromised, regardless of the final system geometry or system manufacture (whether supplied by Omicron, other commercial supplier or self built). The lens incorporates a 'thin-and-slim' profile to ensure 'magic-angle' operation (54°), without software transmission correction. It also allows charge neutralisation sources to operate close to parallel. The standard working distance of 30 mm and the stepped 30-45-50° conical shape of the nose provide optimum access...

Omicron NanoTechnology GmbH www.omicron.de 5 [1] M.P. Seah, I.S, Gilmore, S.J. Spencer, Applied Surface Science 144-145 (1999) PG 132-136 SPHERA Analyser SPHERA includes a 180° hemispherical analyser with double focussing properties for optimum focussing in both energy dispersive and non-dispersive directions. The analyser geometry has been calculated to provide high transmission for optimised count rates and excellent signal-tonoise ratios. The indexed multiple slit mechanism is simple to operate via external switching and allows selection of a range of energy resolutions vs transmission....

Omicron NanoTechnology GmbH www.omicron.de 6 CASCADE Control Software SPHERA is controlled via Omicron’s proven EAC 2000 controller, offering both reliability and quality performance. The latest version of the EAC 2000, is fully integrated with the CASCADE experimental control system, providing the operator an intuitive graphical user interface. It provides all lens, analyser and detector voltages under the control of the experimental command protocol. The availability of a common control platform across the entire Omicron product range ensures the highest levels of development and support...

Omicron NanoTechnology GmbH www.omicron.de 7 O1s C1s N1s Ca2s P2p Cl2p P2s Ca2p 6000 4000 2000 0 c/s 700 500 300 100 0 Binding Energy (eV) Results Imaging The iSPHERA imaging facility allows the operator to rapidly identify regions of interest and then undertake analysis. Large area imaging is ideal for identifying analysis regions on powdered materials or contaminants on the surfaces of metals which cannot be identified optically. Quantitative Analysis The low angular acceptance (±2°) of the SPHERA analyser is key, to analyse the latest Ultra-Thin Film materials. The AR-XPS technique...

SPHERA 401-V03/Sept.08 Printed by Druckerei und Verlag Klaus Koch GmbH Specifications and descriptions contained in this brochure are subject to alteration without notice. Omicron MBE-Variability SPHERA analyser Headquarters: Omicron NanoTechnology GmbH Limburger Str. 75 65232 Taunusstein Germany Tel. +49 (0) 61 28 / 987 - 0 Fax +49 (0) 61 28 / 987 - 185 Web: www.omicron.de or www.omicron-instruments.com e-mail: info@omicron.de We have agents and partners worldwide – please check our website to find your nearest contact. How to contact us Moscow XPS Intensity vs FWHM. Intensities and FWHM...