IntroductionThe document outlines the SPECTALEED family of instruments by Omicron NanoTechnology GmbH, designed for Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES). These instruments are used for high-resolution surface analysis in applications such as crystal preparation and structural investigations.
SPECTALEED FeaturesThe SPECTALEED system provides high k-space resolution LEED patterns, suitable for high ambient light conditions. It features non-magnetic gold-plated molybdenum grids for high transmission and a wide viewing angle, along with a low-energy electron source to minimize light emission, essential for LEED I/V analysis.
Control Unit and SoftwareThe SPECTALEED Control Unit integrates LEED and AES functionalities with PC-controlled data acquisition, supporting various beam energies and currents for both parallel and focused beam operations. The DATAuger software offers multitasking and routines for AES data acquisition, including Fast Scan and Peak Mode.
Advanced LEED ApplicationsThe document details advanced applications of the SPECTALEED system:
- MBD-LEED: Combines molecular beam deposition with LEED for in-situ thin film growth observation.
- MCP-LEED: Uses a channelplate for low beam current applications, ideal for sensitive samples.
- SPA-LEED: Offers high-resolution spot profile analysis for detailed structural information, useful for studying defects, terraces, and phase transitions.
SpectaView SystemSpectaView is a video-LEED system providing real-time imaging and I(V) and I(t) measurements, equipped with a frame grabber and a low-light CCD camera for high-speed data acquisition and analysis.
Specifications and Contact InformationThe document concludes with technical specifications for the SPECTALEED system components and contact information for Omicron NanoTechnology GmbH and its global offices.