MATRIX SPM Control System 205-V03/Feb.08 Best Hardware Performance and S/NՕ 24 Bit z-Resolution Intuitive and High Speed User Interface Օ Instantaneous Parameter Change Dedicated and Advanced Spectroscopy Modes Օ Fast Scan Imaging & High Data Transfer Rates Flexible Experiment Control >

The MATRIX SPM Control System is based on more than 20 years of experience in SPM technology and designed to use the full capacity of Omicrons leading- edge Scanning Probe Microscopes. > The MATRIX concept and architecture couples advances in high-speed, low-noise digital elec- tronics with the requirements of the latest SPM applications to offer the user an unprecedented level of signal quality, measurement speed, and experimental fl exibility. Its expandability is the key to cope with future challenges in Scanning Probe Microscopy. Communications between the host PC and the control elec- tronics...

Experiment Views on data Experiment Structure Experiment Parameters Graphical User Interface (GUI) Experiment structure can be confi gured individually > STM Experiment Catalogue > 2D Scanner Regulator Gap Voltage 2D Scanner > Spectroscopy Channel coming from pre-defi ned libraries > Channel Channel Spectroscopy Channel > Atom Manipulation Timer Atom manipulation > Omicron NanoTechnology GmbHwww.omicron.de

The digital scan generator provides various scan modes (up/down & up only, forward/backward & forward only), defi nition of tip velocity (con-stant scan speed, constant line frequency) and instantaneous start/stop and re-start. All imaging parameters such as size, position, rotation and speed can be changed 'on the fl y' using advanced mouse functionalities at the online scan frame display or at the virtual representation of the current scan area. MATRIX superior hardware technology allows for 200 kHz acquisition rate (5 Եs per image pixel) which equals to 10 images per second at 100x100 pixel...

The intuitive MATRIX user interface enables newco-mers as well as experts to operate with high effi -ciency. Windows can be easily adapted to individual user requirements and all available input and data fi elds can be freely assigned to available or newly generated windows. Communication to the hard- ware is virtually instantaneous. Parameter changes are applied at any scan position with latency times in the 10 ms range, virtually getting the operator 'into touch' with probe and sample. ѕ Direct Accessible MATRIX Raw Data for self-written data processing routines, for self-written converters...

1 Scan range12.5 nm x 12.5 nm 2 Scan range 5 nm x 5 nm 3 Scan range 5 nm x 5 nm 4 Scan range 5 nm x 5 nm > Omicron NanoTechnology GmbHwww.omicron.de size="-1">

Au(111) 22(1)x ѢȚ 3 reconstruction showing extremely low corrugation without distortions: 15 pm for the reconstruction and 4 pm for single atoms. > Highly-resolved non-contact AFM on Ag( 3x Օ 3)/Si(111) 7x7 with Omicron VT Beam Defl ection AFM and Matrix SPM Control System showing atomic resolution and defects. Scan range10 nm x 8 nm High z-resolution STM image on an Au(111) surface with atomic resolution. No digital artefacts visible. The white line marks the position of the line profi le shown below. The overall corruga- tion is between 3 and 5 pm. Setup: Omicron MATRIX V2.0 and Omicron VT...

STM Signal Conversion: Two branch design for signal measurement and signal feedback ADC resolution 16-bit; 400 kHz sampling rate, switchable low pass (300 Hz, 1 kHz, 3 kHz, 10 kHz, 30 kHz) Օ > Gap voltage range: +/- 10 V and +/- 1 V (standard confi guration) 16-bit resolution, external input for modulation with switchable low pass (300 Hz, 3 kHz, 20 kHz, 56 kHz, full BW) Max. 12 additional ADCs: CRTC: Օ Maximum spectroscopy acquisition time per spectroscopy point: 19 seconds Simultaneous over-sampling of all ADCs, maximum over-sampling factor: 2 3 x 4 independent analogue input channels, ADC:...