EKF 300
1 /2Pages

EKF 300

EKF 300
1 /2Pages

Catalog excerpts

EKF 300-1

MBE PRO 753-V01/Oct10 EKF 300 0.1 to 5 KeV (Multi-function) Electron Source With a high beam current, greater than 15 μA, the EKF 300 includes an integral X-Y deflector, with a scan range of more than ± 6 mm. The NGE 52 intuitively displays all the source operating voltages and currents and provides an interface for the remote control of beam energy and beam blanking. The EKF 300 is connected to the NGE 52 through a 12-pin feedthrough in a CF 38 flange and a single cable for all operating and scanning voltages. The wide range of operating characteristics of the EKF 300 are simply set by the grid voltages on the control unit. Two grid voltage ranges, 0 to +60 V (positive) and 0 to –200 V (negative), can be selected by jumpers in the NGE 52. Producing a full range of operation, with maximum flexibility. AES survey spectrum EKF 300, AES on Ag Sample of Ag. 1x106 9x105 Intensity [CPS] 8x105 7x105 6x105 5x105 4x105 3x105 200 400 600 800 1000 1200 1400 Kinetic Energy [eV] 1600 1800 AES narrow scan EKF 300, 5 kV, 10 nA, Ag Auger, CRR 4 spectrum on Ag at high signal for rapid 3.0x106 chemical characterisation. 2.5x106 Intensity [CPS] The EKF 300 Electron Source with the NGE 52 Electron Source Power Supply is a highly versatile 0.1 to 5 keV electron source designed for both static Auger measurements and for use as an electron flood source. The spot size can be adjusted down to 300 μm within an energy range from 1 keV to 5 keV at the standard working distance of 66 mm. 2.0x106 1.5x106 1.0x106 200 250 300 Kinetic Energy [eV] 350 400 The positive range allows the source to operate in a broad spot mode at higher beam currents and low beam energy suitable for some charge neutralisation applications. The negative range allows the source to operate in a small spot mode suitable for AES. EKF 300 electron source for a wide range of AES applications. www.omicron.de

 Open the catalog to page 1
EKF 300-2

Technical Information: EKF 300 Electron Source Minimum spot size, small spot mode (at 66 mm working distance): 300 μm (at 100 nA beam current, energy range from 1 keV to 5 keV) Maximum spot size, broad spot mode (at 66 mm working distance): 10 mm Beam energy: 100 eV to 5 keV Grid voltage range, small spot mode: 0 to –200 V The focus control on the NGE 52 can be used to defocus the beam in either mode. This allows the Grid voltage range, broad spot mode: 0 to +60 V charge neutralisation area to be increased in broad spot mode and when required the small spot mode can be used for charge neutralisation...

 Open the catalog to page 2

All Scienta Omicron catalogs and technical brochures

  1. NanoESCA

    4  Pages

  2. UHV Suitcase

    2  Pages

  3. ARPES-Lab

    4  Pages

  4. XPS-Lab

    2  Pages

  5. TESLA JT SPM

    8  Pages

  6. Argus CU

    7  Pages

  7. UHV NANOPROBE

    12  Pages

  8. Fermi SPM

    8  Pages

  9. Leonova Emerald

    12  Pages

  10. Intellinova

    4  Pages

  11. MULTIPROBE

    8  Pages

  12. ISE 5

    2  Pages

  13. MBD-LEED

    8  Pages

  14. FOCUS PEEM

    16  Pages

  15. Argus

    12  Pages

  16. MULTISCAN Lab

    2  Pages

  17. LT NANOPROBE

    8  Pages

  18. UHV STM 1

    2  Pages

  19. SPHERA

    8  Pages

  20. NanoSAM Lab

    6  Pages

Archived catalogs

  1. VT SPM

    11  Pages

  2. VT SPM_2012

    20  Pages

  3. LT STM_2017

    16  Pages

  4. ESCA+_2010

    8  Pages

  5. LT STM_2012

    16  Pages

  6. EFM 2

    8  Pages

  7. CMA 100

    4  Pages

  8. NanoESCA

    8  Pages

  9. SPECTALEED

    8  Pages

  10. SPM PROBE

    2  Pages

  11. EKF 1000

    2  Pages

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.