Catalog excerpts
Argus CU Next Generation Hemispherical Analyser • Compression Lens • Excellent Sensitivity • True Counting Multi-Anode Detector • Linear Response up to the Highest Count Rates • Excellent Dynamic Range • Snapshot and Dynamic XPS • Chemical State Mapping
Open the catalog to page 1ESCA+ system with the new Argus CU hemispherical analyser. Dispersive plane of energy analyser analyzer MCP Stripe anodes Readout Electronics Aperture defining the sample area seen by the analyser. Inside the new Argus CU hemispherical analyser: 128 channel multi-anode detector with in-vacuum counter electronics. One Step BEYOND Conventional ESCA The Argus hemispherical analyser has superior sensitivity, new detection modes and allows for faster sample analysis when compared to channeltron based systems. A multi-anode detector inside the Argus employs 128 individual counters connected to a...
Open the catalog to page 2Fig. 2 (left): Example of routine XPS measurement: survey spectrum of a clean silver surface Insert (above): Linear dependence between the increase of the X-ray power (DAR 400) and the detected count rate. Faster Analysis Argus CU ensures fast sample analysis with superior sensitivity compared to previous Channeltron detection systems. Besides Argus CU‘s highest sensitivity the key to modern sample analysis are dedicated detection modes such as snapshot XPS, high speed depth profiling and rapid chemical state imaging. Argus CU in combination with the new Fig. 3 Comparison of snapshot (black...
Open the catalog to page 3Fig. 5: The LDR was part of an ex-vacuum serial circuit with a bias current and gated light source. The voltage drop across the LDR changes as soon as sufficient light hits its surface. For the experiment a gated LED (ton = 1 s) was used to switch the photoconductivity of the LDR. The changed local sample voltage results in a kinetic energy shift of the Cd 3d5/2 core-level peak between the light off and light on states. The shift was measured here to be 50 meV, which was fully consistent with the ex-vacuum measured voltage drop across the LDR. The snapshot series with a time resolution in...
Open the catalog to page 4= Cadmium = Indium = Silver Complex Chemical State Mapping 500 µm The Argus CU input lens design includes proven scan deflector technology, allowing effortless, fast and reliable chemical state mapping of the sample. XPS maps provide full peak information including chemical shifts at each pixel (see fig. 11, 12 & 13). Instead of serially scanned plain peak (or peak-background) count rate detection (e.g. on the Cd 3d5/2 peak) the new multi-channel detector records a complete energy interval of the spectrum containing the XPS peak, tails and background at each pixel (see fig. 10). This...
Open the catalog to page 5MATRIX for Electron Spectroscopy The MATRIX concept for spectroscopy gives a user friendly yet extremely powerful interface for experiment control and data acquisition. In addition MATRIX is the first commercial platform to offer combined SPM and electron spectroscopy experiments within the same software. All experiments will provide similar handling and workflows – a key for everyday life in a modern laboratory. The spectroscopy user interface immediately allows even inexperienced users to run the full range of experimental techniques through the intuitive control panel. A well organized...
Open the catalog to page 6Headquarters: Omicron NanoTechnology GmbH Limburger Str. 75 65232 Taunusstein, Germany Tel. +49 (0) 61 28 / 987 - 0 Fax +49 (0) 61 28 / 987 - 185 Web: www.omicron.de e-mail: info@omicron.de East Grinstead Linköping Moscow Poznan Beijing We have agents and partners worldwide – please check our website to find your nearest contact. Seoul Tokyo Taipei Mumbai Omicron NanoTechnology is part of the Oxford Instruments Group. For more information: www.oxford-instruments.com or just send us an e-mail: info.plc@oxinst.com Rome Bucharest Electronics enclosure Technical Information Acquisition modes •...
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