
SEMICONDUCTOR RELIABILITY TESTING BENCHTOP THERMAL CYCLING TEST SYSTEM Localized temperature testing for semiconductor reliability −80°C to +225°C COMPACT BENCHTOP DESIGN For lab benches and component test stations System airflow output Temperature control IC packages · Optical modules · Automotive electronics Localized thermal cycling for reliability testing and failure analysis Discuss your test requirements DISCUSS YOUR THERMAL TEST NEEDS www.sanwood.us info@
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