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Integrated Circuit High-Temperature Dynamic Aging Test System SM-ZOV665-W5K

Integrated Circuit High-Temperature Dynamic Aging Test System SM-ZOV665-W5K

Product catalog summary
Overview: The document describes the SM-ZOV665-W5K, a single-door system designed for semiconductor reliability testing, specifically for dynamic IC burn-in and High-Temperature Operating Life (HTOL) testing. This system is used to test integrated circuits (ICs) under thermal stress to ensure their reliability.
Specifications: The system operates within a temperature range of RT +10°C to +150°C. It features programmable vectors to apply thermal stress during testing. The burn-in chamber interior supports dynamic burn-in and HTOL by exercising ICs under electrical bias at elevated temperatures.
Capacity and Configuration: The system includes 16 Burn-In Board (BIB) slots, each measuring 450 × 570 mm. It supports 184 channels, with 160 common drive (DRV) channels and 24 input/output (I/O) channels. The maximum system repetition rate is 20 MHz.
Applications: The system is suitable for testing AI accelerators, automotive System on Chips (SoCs), and memory ICs. It provides per-slot logging of voltage, current, and temperature, allowing for detailed monitoring and analysis.
Customization and Contact: The internal dimensions of the chamber are 800 × 1320 × 630 mm. Custom chamber sizes and test racks are available to meet specific testing requirements. For further discussion on burn-in requirements, contact information is provided: [email protected] and www.sanwood.us.
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Catalog excerpts

Integrated Circuit High-Temperature Dynamic Aging Test System SM-ZOV665-W5K-1

SEMICONDUCTOR RELIABILITY TESTING & HTOL TEST SYSTEM Single-door system for semiconductor reliability RT +10°C to +150°C Programmable vectors under thermal stress BURN-IN CHAMBER INTERIOR Dynamic burn-in and HTOL Exercise ICs under electrical bias at elevated temperature. Internal size (W × H × D) 800 × 1320 × 630 mm Custom chamber sizes and test racks System repetition rate AI accelerators · Automotive SoCs · Memory ICs Per-slot voltage, current and temperature logging Discuss your test requirements DISCUSS YOUR BURN-IN REQUIREMENTS www.sanwood.us info@sanwo

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Archived catalogs

  1. 2018 sanwood

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