
SEMICONDUCTOR RELIABILITY TESTING & HTOL TEST SYSTEM Single-door system for semiconductor reliability RT +10°C to +150°C Programmable vectors under thermal stress BURN-IN CHAMBER INTERIOR Dynamic burn-in and HTOL Exercise ICs under electrical bias at elevated temperature. Internal size (W × H × D) 800 × 1320 × 630 mm Custom chamber sizes and test racks System repetition rate AI accelerators · Automotive SoCs · Memory ICs Per-slot voltage, current and temperature logging Discuss your test requirements DISCUSS YOUR BURN-IN REQUIREMENTS www.sanwood.us info@sanwo
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