
SEMICONDUCTOR RELIABILITY TESTING & HTOL TEST SYSTEM Double-door system for parallel semiconductor testing RT +10°C to +150°C Parallel IC testing under thermal stress DUAL-CHAMBER INTERIOR Two hot chambers 16 horizontal BIB slots in each chamber 450 × 570 mm per burn-in board Internal size per chamber (W × H × D) 800 × 1320 × 630 mm Custom chamber sizes and test racks System repetition rate AI accelerators · Automotive SoCs · Memory ICs Dynamic electrical stress for parallel burn-in and HTOL Discuss your test requirements DISCUSS YOUR BURN-IN REQUIREMENTS www.sanwood.us info@sanwo
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