
SEMICONDUCTOR TESTING HAST TEST CHAMBER Semiconductor Package Reliability +105°C to +135°C +145°C available on a special optional model Highly Accelerated Stress Testing MOISTURE RELIABILITY Pressurized vapor test chamber Investigate moisture-related degradation in non-hermetic semiconductor packages. Single / Dual Humidity control range Temperature fluctuation Chamber options Independent dual control IC packages · DRAM · NAND Flash Qualification · Material comparison · Process verification Discuss your test requirements ACCELERATE MOISTURE TESTING. www.sanwood.us info@san
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