
SEMICONDUCTOR PACKAGE RELIABILITY DUAL-CHAMBER HAST TEST CHAMBER Two stacked chambers. Flexible test scheduling. DUAL-CHAMBER CONFIGURATION 75–100% RH Humidity control range Controlled moisture exposure Standard HAST ranges; configuration by project Independent upper and lower chamber control Same or different profiles within the operating range ACCELERATED MOISTURE RELIABILITY Parallel testing, compact footprint Run separate batches in stacked chambers. Optimize floor space and test scheduling. JESD22-A110 · JESD22-A118 Biased / unbiased HAST configurations Bias equipment, feedthroughs and fixtures by project Parallel testing Independent control Flexible test profiles Gauge pressure range INDEPENDENT TEST PROFILES SPACE-EFFICIENT DESIGN Same or different test conditions Two chambers in one vertical cabinet Discuss your test requirements FIND THE RIGHT CHAMBER FOR YOUR TEST www.sanwood.us info@sanwood
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