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HAST Test Chamber (Dual-Chamber) SM-HAST-45A-2

HAST Test Chamber (Dual-Chamber) SM-HAST-45A-2

Product catalog summary
Overview: The document describes a dual-chamber HAST (Highly Accelerated Stress Test) test chamber designed for semiconductor package reliability testing. It highlights the flexibility and efficiency of the dual-chamber configuration.
Dual-Chamber Configuration: The test chamber features two stacked chambers with independent control, allowing for flexible test scheduling. The temperature range is from +105°C to +135°C, and it supports both same and different test profiles within this range. Humidity control is available from 75% to 100% RH, ensuring controlled moisture exposure.
Accelerated Moisture Reliability: The design allows for parallel testing with a compact footprint, optimizing floor space and test scheduling. It supports both biased and unbiased HAST configurations, with bias equipment, feedthroughs, and fixtures customizable by project.
Specifications: The gauge pressure range is from 0.02 to 0.230 MPa. The chambers can operate independently, allowing for different test conditions in each chamber.
Space-Efficient Design: The two chambers are housed in one vertical cabinet, maximizing space efficiency.
Standards and Compliance: The chamber complies with JESD22-A110 and JESD22-A118 standards, ensuring industry-standard testing procedures.
Contact Information: For further inquiries or to discuss test requirements, contact Sanwood at [email protected] or visit their website at www.sanwood.us.
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Catalog excerpts

HAST Test Chamber (Dual-Chamber) SM-HAST-45A-2-1

SEMICONDUCTOR PACKAGE RELIABILITY DUAL-CHAMBER HAST TEST CHAMBER Two stacked chambers. Flexible test scheduling. DUAL-CHAMBER CONFIGURATION 75–100% RH Humidity control range Controlled moisture exposure Standard HAST ranges; configuration by project Independent upper and lower chamber control Same or different profiles within the operating range ACCELERATED MOISTURE RELIABILITY Parallel testing, compact footprint Run separate batches in stacked chambers. Optimize floor space and test scheduling. JESD22-A110 · JESD22-A118 Biased / unbiased HAST configurations Bias equipment, feedthroughs and fixtures by project Parallel testing Independent control Flexible test profiles Gauge pressure range INDEPENDENT TEST PROFILES SPACE-EFFICIENT DESIGN Same or different test conditions Two chambers in one vertical cabinet Discuss your test requirements FIND THE RIGHT CHAMBER FOR YOUR TEST www.sanwood.us info@sanwood

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