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ESS Rapid-Rate Temperature Change Test Chamber SM-KS-1000C-F10-W-I

ESS Rapid-Rate Temperature Change Test Chamber SM-KS-1000C-F10-W-I

Product catalog summary
Overview: The document describes the features and capabilities of the SM-KS-1000C-F10-W-I Rapid Temperature Change Chamber, designed for Environmental Stress Screening (ESS) to reveal latent defects in components before shipment.
Specifications: The chamber operates within a temperature range of −40°C to +180°C and supports programmable thermal cycling profiles. It is equipped with dual front ports for in-chamber sample handling, allowing hands-on access without opening the main door.
Features: The chamber includes two-handed sample adjustment capabilities, enabling users to position samples and adjust fixtures with the main door closed. It supports rapid cycling and customizable test profiles tailored to specific applications.
Standards and Compliance: The chamber adheres to IEC 60068-2-14 and JESD22-A104 standards, ensuring method and load matched test profiles. Optional monitoring and data recording features are available.
Applications: Suitable for electronics, modules, and assemblies, the chamber is designed for reliability screening and repeatable stress testing of components.
Customization and Support: The chamber's dimensions, test racks, and access configuration can be customized to meet specific test requirements. Users are encouraged to discuss their test needs with the manufacturer.
Contact Information: For further inquiries, visit www.sanwood.com or contact [email protected].
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Catalog excerpts

ESS Rapid-Rate Temperature Change Test Chamber SM-KS-1000C-F10-W-I-1

ENVIRONMENTAL STRESS SCREENING HAND-ACCESS ESS RAPID TEMPERATURE CHANGE CHAMBER Dual front ports for in-chamber sample handling DUAL PORTS Hands-on sample access Without opening the main door C-range model · Programmable thermal cycling profiles Reveal latent defects before shipment Repeatable stress screening for components HAND-ACCESS PORT DETAIL Two-handed sample adjustment Position samples and adjust fixtures with the main door closed. IEC 60068-2-14 · JESD22-A104 Method and load matched test profiles Optional monitoring and data recording Rapid cycling Programmable test profiles Hands-on sample handling Dimensions & test racks Test profiles and access configuration tailored to the application ADJUST SAMPLES WITH THE MAIN DOOR CLOSED Electronics · Modules · Assemblies · Reliability screening Discuss your test requirements FIND THE RIGHT CHAMBER FOR YOUR TEST www.sanwood.com info@sanwo

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