
SEMICONDUCTOR RELIABILITY TESTING eMMC MEMORY BURN-IN TEST SYSTEM Parallel reliability testing for embedded flash −70°C to +150°C Endurance and data retention testing BURN-IN CHAMBER INTERIOR LS407H · Dual chamber 600 × 1100 × 700 mm per chamber Custom chamber sizes and test racks Parallel screening Read, write, erase High-density eMMC testing Programmable patterns Per-slot voltage control Automotive storage · Consumer IoT · Industrial electronics eMMC and NAND flash reliability screening under thermal stress Discuss your test requirements DISCUSS YOUR eMMC TEST REQUIREMENTS www.sanwood.us info@
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