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eMMC Memory Burn-in Test System SC-588-CD-F

eMMC Memory Burn-in Test System SC-588-CD-F

Product catalog summary
Overview: The document outlines the specifications and capabilities of the SC-588-CD-F and LS407H burn-in test systems designed for parallel reliability testing of embedded flash memory, specifically eMMC memory. These systems are used to conduct endurance and data retention testing under thermal stress conditions.
Specifications:
  • Temperature Range: The systems operate within a temperature range of -70°C to +150°C.
  • Chamber Dimensions: The SC-588-CD-F has an internal volume of 588 liters with dimensions of 800 × 1050 × 700 mm. The LS407H features dual chambers, each measuring 600 × 1100 × 700 mm.
  • Customization: Custom chamber sizes and test racks are available to meet specific testing needs.
Testing Capabilities:
  • Parallel Screening: The systems support high-density eMMC testing with capabilities for read, write, and erase operations.
  • Programmable Patterns: Users can program specific test patterns to suit their testing requirements.
  • Voltage Control: Per-slot voltage control is available for VCC and VCCQ, allowing precise testing conditions.
Applications: These systems are suitable for testing in various sectors, including automotive storage, consumer IoT, and industrial electronics, focusing on eMMC and NAND flash reliability screening under thermal stress.
Contact Information: For further discussion on eMMC test requirements, contact Sanwood via their website at www.sanwood.us or email at [email protected].
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Catalog excerpts

eMMC Memory Burn-in Test System SC-588-CD-F-1

SEMICONDUCTOR RELIABILITY TESTING eMMC MEMORY BURN-IN TEST SYSTEM Parallel reliability testing for embedded flash −70°C to +150°C Endurance and data retention testing BURN-IN CHAMBER INTERIOR LS407H · Dual chamber 600 × 1100 × 700 mm per chamber Custom chamber sizes and test racks Parallel screening Read, write, erase High-density eMMC testing Programmable patterns Per-slot voltage control Automotive storage · Consumer IoT · Industrial electronics eMMC and NAND flash reliability screening under thermal stress Discuss your test requirements DISCUSS YOUR eMMC TEST REQUIREMENTS www.sanwood.us info@

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