
MEMORY RELIABILITY TESTING BIB MEMORY BURN-IN TEST SYSTEM High-Density DRAM & Flash Reliability SMG2-600-CB-W Temperature fluctuation* Temperature deviation** Dual-bay chamber volume *Steady state with a full, unpowered BIB load. **Based on the average temperature deviation at each sensor. DRAM · LPDDR · NAND Flash HBM · Automotive Storage ICs Modular BIB slots Per-slot OCP / OVP protection Discuss your test requirements SCREEN MEMORY. BUILD RELIABILITY.
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