3D Universal Optical Microscopes Profilometer Series Surface Roughness, Step Height, 3D Topography Cracks, Defects, Slope Measurement, Film Thickness, Sub Surface Feature
Open the catalog to page 1Impressive and Quick 3D Surface Profilometer 3D Profilometry Without Compromise 5 Imaging Modes in 1 Microscope Interferometry, Confocal, Dark Field, Bright Field, Variable Focus The UP Series provides non-contact surface measurements from nano to micro and combines five imaging modes in one head to characterize all types of surfaces. One click causes the profilometer to switch between the different imaging modes automatically. Precise surface analysis in industry and research is essential to ensure optimal performance of materials and components Fast Scanning Speed High pixel colored images...
Open the catalog to page 2Universal Profilometer Unlike Any Other Bright Field High speed and resolution 5 Imaging Modes in 1 Microscope 3D Optical Surface Metrology Dark Field Magnifies cracks and defects White Light Interferometer (WLI) Confocal Microscopy Mode Bright Field Mode Highest Z resolution. A big plus for flat, nm height measurements. Highest lateral resolution. A big plus for transparent, translucent, steep slopes, multi-layer, or rough samples Dark Field Mode Highest contrast imaging. Detects cracks, defects, and failures with high resolutions not possible with any optical technique. Focus Variation Measures...
Open the catalog to page 33D Microscope For Multiple Applications Automatic Image Stitching The Most Powerful Package of Analysis On The Market The UP Series acquires a real color image without any sample movement. Our software package includes automatic image stitching, ensuring the acquisition of bigger images. This mode offers the automated imaging of large surfaces at high magnifications. Coin Vickers Hardness Wafer bumps Micro fluid chip Turning surface
Open the catalog to page 4InterferometryFastest area scanning confocal technique in the marketHighest Z Resolution In Non-Contact Profilometry Nipkow Confocal Microscopy (Lambda Head) represents the best confocal technique. Rather than a single pinhole, the Lambda head has a thousand pinholes arranged on an opaque disk. These several simultaneously present pinholes that scan the sample, allowing highspeed 3D image creation with nm resolution. Our Lambda Confocal head offers the best speed and resolution of any other confocal technique, such as point confocal to scan the surface using the XY stage, scanning XY mirrors...
Open the catalog to page 5Profilometer Series 150-mm Z-axis with advanced encoder Tilt table XY Stage * More custom options are available
Open the catalog to page 6Software A complete software package is provided with all UP Series instruments. Imaging analysis • Roughness • 3D imaging • Volume of wear or holes • Step height • Additional Features 3D Profilometry for Inspection of Surfaces Colored Images Measuring the 3D surface topography has become increasingly important in industrial automation, particularly in in-situ product inspection. Our 3D optical profilers provide many benefits over other measurement methods used for non-contact inspection. These benefits range from rapid measurement speeds and custom analysis to completely automated measurements...
Open the catalog to page 7Specifications The UP modules series has several test-specific data traceability standards and quick platform checkups. The instruments also come with standard test recipes to ensure normalized testing. Real-time imaging of 3D surface topography. Overlay color and intensity images on 3D topography. Data acquisition artifact processing - outliers, local defects. Roughness and surface texture - with the latest ISO and national standards. Extraction and analysis regions of interest (Page viewer for fast navigation.) Modules for advanced surface texture analysis, contour analysis, grains, and particles...
Open the catalog to page 8Rtec-Instruments Inc USA 1810 Oakland Road, Ste B San Jose, CA, 95131, USA +1 408 708 9226 [email protected] Rtec-Instruments Office Agent / distributor Rtec-Instruments, CN China 8th Floor, Building A, Juntai International, No. 300 Xicheng Rd, Jianye District, Nanjing, China 210019 +86 025 83210072 [email protected] Rtec-Instruments, JP Japan Tokatsu Techno Plaza, Rm 409 5-4-6 Kashiwanoha, Kashiwa-shi, Chiba, Japan, 227-0882 +81-50-5896-9916 [email protected] 2024 Rtec-Instruments Product Catalogue. All rights reserved. All specifications are typical and subject...
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