Group: Rohde & Schwarz
Catalog excerpts
R&S®ZVB Vector Network Analyzer High measurement speed up to 20 GHz with two or four test ports
Open the catalog to page 1R&S®ZVB Vector Network Analyzer At a glance Built using innovative hardware and software concepts, the vector network analyzers of the R&S®ZVB family set new standards: One generator can feed two test ports simultaneously. This makes parallel measurements possible, significantly increasing performance despite the complexity of the measurement task at hand. In particular, multiport measurements such as performed on balanced SAW filters, duplex filters or antenna switching modules can be completed very quickly. The R&S®ZVB combines excellent performance with low weight and compact design....
Open the catalog to page 2R&S®ZVB Vector Network Analyzer Benefits and key features High performance for fast and reliable measurements ❙❙ Reflectometers with separate measurement and reference channels ❙❙ Parallel measurements on multiple ports ❙❙ Data processing and transfer simultaneously with measurement ❙❙ DC bias for active DUTs ▷▷ page 4 Ergonomic user interface ❙❙ User-configurable display of results ❙❙ Manual operation support ❙❙ Fast switching between instrument setups ❙❙ Editor for trace mathematics ▷▷ page 6 Advanced measurement functionality ❙❙ Independent channels ❙❙ Convenient marker and analysis...
Open the catalog to page 3High performance for fast and reliable measurements Applied at rear panel Reference receiver a4 RF generator 2 PORT 4 DC bias Applied at rear panel Reference receiver a1 Applied at rear panel Reference receiver a3 RF generator 1 PORT 3 DC bias Applied at rear panel The R&S®ZVB’s innovative concept significantly enhances measurement speed, configuration capabilities and system characteristics. The test set consists of reflectometers that have their own measurement and reference channels. The signal from each RF generator is split in order to supply two test ports. Electronicswitches in the...
Open the catalog to page 4Parallel measurements on multiple ports High-speed parallel measurements can be achieved b ecause the generator signalcan be output to multiple test ports simultaneously, plus data can be captured at multiple ports simultaneously and all displayed at the same time. For example, the R&S®ZVB four-port version makes it possible to measure two two-port DUTs simultaneously, thus doubling performance. It is also possible to measure and display the four reflection parameters S11 to S44 simultaneouslyon a four-port DUT (provided that DUT ports are uncoupled). This reduces measure ent time by m...
Open the catalog to page 5Ergonomic user User-configurable display of results i More than 100 traces and diagrams i Flexible assignment of traces to diagrams; hiding and i Adjustment of diagram size by mouse i Enlarging of individual diagrams to full screen size for optimum readability by clicking the mouse or pressing i User-definable labeling of diagrams, setups, markers, traces and channels for straightforward documentation Manual operation support i Operation via hardkeys and softkeys or keyboard and i Online help providing information about current menu item including associated IEC/IEEE bus commands i...
Open the catalog to page 6Fast switching between instrument setups ❙❙ Simultaneous loading of several omplete instrument c s etups into RAM (preloading) ❙❙ Each instrument setup represented by a separate measurement window ❙❙ Switching between instrument setups (setup swap) s imply by switching between measurement windows by clicking the mouse or pressing a key ❙❙ Extremely fast setup swap by IEC/IEEE bus command in < 10 ms ❙❙ Easy management and clear-cut epresentation of data – r even with a large number of different measurements and measured quantities Editor for trace mathematics ❙❙ Editor with numerous...
Open the catalog to page 7Advanced measurement functionality Independent channels ❙❙ Simultaneous management of more than 100 independent channels ❙❙ User-definable coupling of traces and channels ❙❙ Simultaneous display of numerous parameters of a DUT under different stimulus conditions Convenient marker and analysis functions ❙❙ Up to ten markers per trace ❙❙ Various marker data formats ❙❙ Detailed definition of marker roperties (line/triangle, p information at marker position, etc.) ❙❙ Marker information can be positioned on screen as required ❙❙ Marker values can optionally be displayed and printed in the...
Open the catalog to page 8Highlights of the R&S®ZVB in production Integrated PC with Windows XP for automated procedures and data management ❙❙ Analysis and control programs for test and production sequences can be run directly on the R&S®ZVB ❙❙ The R&S®ZVB can be networked with system components such as measuring instruments or handlers via its LAN, IEC/IEEE bus and USB inter aces or its f universal TTL interface Optimization of test and production sequences ❙❙ Switchover between several channels instead of loading setups ❙❙ Simultaneous loading of several instrument setups into RAM (preoading) for extremely...
Open the catalog to page 9Mixer and harmonics measurements ❙❙ Conversion loss of mixers versus requency and power f ❙❙ Amplitude of harmonics of any order versus frequency and power ❙❙ LO signal supplied by second internal generator or external generator Data import and export ❙❙ Export and import of traces in *.snp (Touchstone), ASCII or MATLAB® ormat f ❙❙ Display of imported traces as memory traces or limit lines ❙❙ Access to correction values ❙❙ Access to measured values of alibration standards c Measurement times and data transfer times ❙❙ Data transfer via LAN or IEC/IEEE bus ❙❙ Data transfer...
Open the catalog to page 10Multiport measurements i Minimum number of sweeps through parallel data i Extremely fast measurement of multiport devices i Excellent accuracy due to multiport calibration Configuration of a balanced measurement. ft.il.inr. I'll .Mill Mr.iMjml I'm '■■ Pv«4*fcl«409flfig» Oflrl8*l*i**tiPorl 0iS48l**ByPW Ootrld MOMmOtf Porlj Lagiol Pane Balanced measurements i Analyzer model with up to four integrated test ports i Calculation of mixed-mode S-parameters i Complete characterization of DUTs with balanced test ports or with mixed single-ended and balanced test ports i S-parameters, impedances,...
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