750 Series
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Catalog excerpts

750 Series - 1

750 Universal Base for Interchangable Modules Overview The 750 series is an compact mechanical test press that fits benchtop testing environments. Each test fixture has a universal base for use with interchangeable electrical interface modules that are customized to testing specifications and requirements. This versatility makes it ideal for singular or multisite configuration. The bed of nails design permits testing custom PCB modules and small-scale subassemblies. Optional floating base allows DUTs to be placed in the fixture without contact to the pogo pins until the lid is fully closed. The key feature and design facet of this test fixture is the vertical clamshell lid. It provides a vertical closing action before contact to UUTs, insuring alignment and even pressure to prevent damage to the pogo pins. Linear bearings provide smooth and accurate operation. The 750 series combines ease of use, operator efficiency, and repeatability in engineering, production, and testing, making it one of the most prominent benchtop fixtures on the market. RTI designs and manufacture the 750 series to meet your test specifications and requirements. This includes the pogo pin block, UUT alignment, and the Pin Electronics Interconnect PCB. At RTI, we enjoy a contest of our skills. Contact RTI today and challenge our capabilities with your new project. (interface Module without Floating Base) (interface Module with Floating Base)

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750 Series - 2

Features 0 interface module routes to electrical connector of choice 0 single site or multisite configuration 0 universal and device specific lids 0 for use with devices down to a fine pitch 0 easy access to UUTs 0 PCB based interconnect - no discrete wiring 0 pogo pins are easy to replace Design Facet 100% vertical clamshell lid provides a vertical closing action before contact to UUTs, insuring alignment and even pressure to prevent damage to the pogo pins. Fully open position allows easy access to the test surface for insertionand removal of UUTs. Reduce cost of test by reusing the...

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