Speed Accuracy Flexibility REVO® high performance 5-axis measurement system The REVO system’s range of tactile scanning, touch-trigger, surface finish, ultrasonic and vision measurement probes provides the choice of an optimum tool to measure multiple features, all on a single CMM platform.

5-axis measurement technology For more than 40 years, Renishaw has delivered innovations that have been milestones in industrial metrology, from the original touch-trigger probe and motorised indexing head to repeatable stylus changing and modular scanning systems. Renishaw’s 5-axis measurement technology represents the biggest stepchange in measurement capability that has ever been introduced. What is 5-axis measurement? Based on advanced head, sensor and control technology, Renishaw’s 5-axis measurement technology delivers unprecedented measuring speed and flexibility, whilst avoiding the speed...

Increased throughput with 5-axis measurement The ultimate scanning speed of a CMM is limited by machine dynamics, typically to between 80 and 150 mm/sec. However, long before this limit has been reached, measurement accuracy decreases – often limiting the effective maximum measuring speed to between 10 and 20 mm/sec. Reduce measurement cycle times without compromising accuracy • Eliminate bottlenecks • Rapid process feedback Non-linear motion on a Cartesian CMM induces accelerations and decelerations that twist and deflect the machine structure, and these dynamic deflections result in measurement...

Renishaw’s unique 5-axis measuring techniques 5-axis scanning • Simultaneous motion control of 5 axes The 5-axis motion and infinite positioning capability of the REVO head enable blended scanning, seamlessly combining two different scanning techniques. Bores can be measured using touch points, circular scans or helical scans, whilst data on contoured surfaces and edges can be captured with a sweeping motion of the head. • Data gathered ‘on the fly’ whilst the head is moving • Dynamic 2-axis head provides most of the stylus motion • Unique tip-sensing probe technology • Scanning with 5 axes of...

REVO® 5-axis multi-sensor scanning system Every process and feature in a REVO system has been designed to enable users to achieve previously unobtainable levels of inspection throughput: • -axis complex form scanning; REVO’s ability to gather 5 very large quantities of accurate inspection data at ultrahigh scanning speeds is invaluable • ery high-speed gathering of touch points using the servo V head’s infinitely variable 2-axis motion • nnovative, patented tip-sensing probe technology allowing I the sensing to be very close to the surface measured, yielding better accuracy, even with long styli...

REVO® system probes RSP2 is a dedicated lightweight tip-sensing probe for use on REVO systems, capable of 2D-scanning (X, Y) and 3D-touch-trigger measurement. RSP3 provides the REVO system with 3D-scanning (X, Y, Z) and crank stylus capabilities. The RSP2 has a universal body to which a number of different length stylus holders, with a maximum reach of 500 mm, can be fitted. The RSP2 works by using an enclosed laser that is directed onto a reflector at the stylus tip. As the stylus touches the part and bends, the reflector is displaced. The altered return path of the laser is then sensed and...

RSP3-6 RSP3-6 provides enhanced capability for accessing deep bores and inspecting features within large parts. The probe can carry a range of stylus holders for applications requiring straight and cranked extensions and can be used for both touch-trigger and 2D scanning measurement. • Reach - Available with straight extensions up to 800 mm from REVO-2’s A-axis centre of rotation, and cranked extensions up to 600 mm • Accuracy - Scanning accuracy; typically better than 10 μm form error (filtered) and 5 μm diameter error. Touch-trigger accuracy; typically better than 3 μm form and diameter error...

SFP2 surface finish probe Surface finish measurement has traditionally required the use of hand-held sensors or moving the part onto a dedicated measuring machine. The SFP2 probe makes surface finish inspection an integral part of your CMM measurement, enabling automatic switching from dimensional to surface finish measurement. The SFP2 probe offers numerous benefits • FP2 benefits from the REVO system’s infinite positioning S and 5-axis movement, and features an integral motorised C-axis • MM programs can include automated and C operator-independent surface finish measurement. All results, including...

Enhanced access for non-contact vision measurement RVP provides high performance 5-axis measurement for non contact applications. 5-axis motion between part features and real time image processing dramatically increase data collection rates for small features and delicate or flexible parts that cannot be measured using tactile probes. The RVP system comprises a vision probe body, vision modules, rack ports and a calibration artefact. The image capture and processing components of the system are held inside the vision probe body and include an industry standard, robust, CMOS sensor for reliable...

RUP1 ultrasonic probe The RUP1 ultrasonic probe increases the multi-sensor capability of the REVO system, offering ultrasonic thickness inspection. Unlike many other ultrasonic systems, the RUP1 probe uses an innovative elastomer tip ball to provide excellent coupling between the probe and the material. System characteristics The RUP1 probe is fully compatible with the MRS2 change rack using the RCP TC-3 rack change port and is interchangeable with all other probe options available for the REVO system. The RUP1 probe is fully integrated into MODUS™ metrology software (version 1.12) and UCCsuite...

5-axis measurement controller technology Renishaw’s UCC controllers provide the powerful platform for 5-axis measurement systems, bringing unprecedented flexibility and productivity to CMM users. The UCC S5 is designed to meet the exacting demands of 5-axis scanning and the processing of 4,000 data points per second at speeds of up to 500 mm/sec. It also provides smooth, simultaneous motion of the CMM and head axes ensuring minimal dynamic deflection of the CMM structure for optimal metrology performance. Renishaw’s UCC controllers support the I++DME command protocol which is also supported by...